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- Q62796579 description "article" @default.
- Q62796579 description "im Februar 2010 veröffentlichter wissenschaftlicher Artikel" @default.
- Q62796579 description "wetenschappelijk artikel" @default.
- Q62796579 description "наукова стаття, опублікована в лютому 2010" @default.
- Q62796579 name "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 name "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 type Item @default.
- Q62796579 label "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 label "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 prefLabel "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 prefLabel "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
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- Q62796579 P1476 Q62796579-46B81B5C-7402-4285-A228-2601FD8D2A34 @default.
- Q62796579 P2093 Q62796579-74300F9D-A0D1-43DF-9A96-D97E79FE1F52 @default.
- Q62796579 P2093 Q62796579-8F244F21-42D0-484C-BB89-293D13C6DB80 @default.
- Q62796579 P304 Q62796579-73E57673-DE6F-4BB6-AF0E-9CBEFB797BF3 @default.
- Q62796579 P31 Q62796579-92E32432-3BD8-4C1D-8A6A-AEB3D2AC59D8 @default.
- Q62796579 P356 Q62796579-D38A092F-E606-4358-9361-6A4040761F74 @default.
- Q62796579 P433 Q62796579-B1547ADC-F656-4E5C-88DA-45CD224B32F7 @default.
- Q62796579 P478 Q62796579-E84B46E3-67A5-475F-8953-430F884839D7 @default.
- Q62796579 P50 Q62796579-BD08C58D-B4F9-4836-B4AC-1C5337D101D0 @default.
- Q62796579 P577 Q62796579-D3FF6E79-1C40-49F9-A591-B03BC3E305DB @default.
- Q62796579 P356 JJAP.49.025201 @default.
- Q62796579 P1433 Q2366671 @default.
- Q62796579 P1476 "Bias Potential for Tip–Plane Systems in Kelvin Probe Force Microscopy Imaging of Non-uniform Surface Potential Distributions" @default.
- Q62796579 P2093 "Jerzy Konior" @default.
- Q62796579 P2093 "Krzysztof Sajewicz" @default.
- Q62796579 P304 "025201" @default.
- Q62796579 P31 Q13442814 @default.
- Q62796579 P356 "10.1143/JJAP.49.025201" @default.
- Q62796579 P433 "2" @default.
- Q62796579 P478 "49" @default.
- Q62796579 P50 Q57570486 @default.
- Q62796579 P577 "2010-02-22T00:00:00Z" @default.