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- Q73274038 description "articolo scientifico (pubblicato il 2000)" @default.
- Q73274038 description "artikull shkencor i botuar më 01 janar 2000" @default.
- Q73274038 description "artículu científicu espublizáu en xineru de 2000" @default.
- Q73274038 description "im Jahr 2000 veröffentlichter wissenschaftlicher Artikel" @default.
- Q73274038 description "scientific article published on 01 January 2000" @default.
- Q73274038 description "wetenschappelijk artikel" @default.
- Q73274038 description "wüsseschaftlicher Artikel, wo im Johr 2000 veröffentlicht worden isch" @default.
- Q73274038 description "наукова стаття, опублікована в січні 2000" @default.
- Q73274038 name "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 name "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 name "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 type Item @default.
- Q73274038 label "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 label "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 label "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 prefLabel "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 prefLabel "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 prefLabel "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 P1433 Q73274038-2F835B4F-E183-4DAF-82DC-4688AFE41BF4 @default.
- Q73274038 P1476 Q73274038-BBBD82AE-A945-48A6-AD1A-A3FC91832887 @default.
- Q73274038 P2093 Q73274038-66EE37B4-3A67-44E3-A8E3-4BED60752F9C @default.
- Q73274038 P2093 Q73274038-8D3E532F-D18A-4AFF-AB86-21506CF8D36F @default.
- Q73274038 P2093 Q73274038-9F1843FC-98BB-4CF2-A239-5632BEA2FF74 @default.
- Q73274038 P304 Q73274038-50468BD6-EDFE-4E85-B574-C90C038AEF87 @default.
- Q73274038 P31 Q73274038-F518599F-F434-459E-88A1-64D8314517C7 @default.
- Q73274038 P356 Q73274038-02B143D0-3889-4ACC-8E5E-768563A6A8DE @default.
- Q73274038 P433 Q73274038-F7A4257B-D024-4CC3-A6A8-9FEC4D980092 @default.
- Q73274038 P478 Q73274038-7150AC71-D662-42F5-84EA-035D10143593 @default.
- Q73274038 P577 Q73274038-9EBA967B-4F07-4188-9687-BD8D40A9FA3E @default.
- Q73274038 P698 Q73274038-C5030963-84FD-4838-8266-2E5228BBD1FC @default.
- Q73274038 P356 OXFORDJOURNALS.JMICRO.A023802 @default.
- Q73274038 P698 11108045 @default.
- Q73274038 P1433 Q15746444 @default.
- Q73274038 P1476 "Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy" @default.
- Q73274038 P2093 "Finnie P" @default.
- Q73274038 P2093 "Homma Y" @default.
- Q73274038 P2093 "Ogino T" @default.
- Q73274038 P304 "225-229" @default.
- Q73274038 P31 Q13442814 @default.
- Q73274038 P356 "10.1093/OXFORDJOURNALS.JMICRO.A023802" @default.
- Q73274038 P433 "2" @default.
- Q73274038 P478 "49" @default.
- Q73274038 P577 "2000-01-01T00:00:00Z" @default.
- Q73274038 P698 "11108045" @default.