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- Q74393792 description "artículu científicu espublizáu en xunetu de 1993" @default.
- Q74393792 description "im Juli 1993 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74393792 description "scientific article published on 01 July 1993" @default.
- Q74393792 description "wetenschappelijk artikel" @default.
- Q74393792 description "наукова стаття, опублікована в липні 1993" @default.
- Q74393792 name "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 name "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 type Item @default.
- Q74393792 label "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 label "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 prefLabel "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 prefLabel "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 P1104 Q74393792-6F0D7647-8314-40C9-B214-29D04AE67B36 @default.
- Q74393792 P1433 Q74393792-B475943C-7D9E-45AB-8F7D-00699FE4AF66 @default.
- Q74393792 P1476 Q74393792-11801D7C-5D63-4026-A44E-D29642645A1F @default.
- Q74393792 P2093 Q74393792-1E3605B7-7678-44E5-8346-1F3F74D70675 @default.
- Q74393792 P2093 Q74393792-285858D0-8027-43E1-9C75-0589EFEA7262 @default.
- Q74393792 P2093 Q74393792-C7BB95C6-E3D6-498B-8451-F797051A0E12 @default.
- Q74393792 P2093 Q74393792-F7B08BAE-1792-4F40-82DD-6BFE663FBF10 @default.
- Q74393792 P304 Q74393792-D0597FBD-3D01-471A-8A53-5C941C8AEFA7 @default.
- Q74393792 P31 Q74393792-74E219F7-2301-4336-8225-E33777484FF0 @default.
- Q74393792 P356 Q74393792-95355763-0CF7-4003-B1CE-72C691220219 @default.
- Q74393792 P407 Q74393792-D7FFEC51-5CDE-4B4C-AC58-CA391AE46D5C @default.
- Q74393792 P433 Q74393792-70973E32-4D82-4F66-BAF0-057E1CA93728 @default.
- Q74393792 P478 Q74393792-5FAA3A6A-133A-4516-8F93-B3E66B763880 @default.
- Q74393792 P577 Q74393792-F8970311-E109-4A53-ACB6-362CF448A9A1 @default.
- Q74393792 P698 Q74393792-79C25FB2-0514-440E-BEED-07B25B252B5C @default.
- Q74393792 P356 PHYSREVB.48.2175 @default.
- Q74393792 P698 10008609 @default.
- Q74393792 P1104 "+8" @default.
- Q74393792 P1433 Q2284414 @default.
- Q74393792 P1476 "Effects of annealing on hydrogen microstructure in boron-doped and undoped rf-sputter-deposited amorphous silicon" @default.
- Q74393792 P2093 "Gleason KK" @default.
- Q74393792 P2093 "Jia H" @default.
- Q74393792 P2093 "Mitra S" @default.
- Q74393792 P2093 "Shinar J" @default.
- Q74393792 P304 "2175-2182" @default.
- Q74393792 P31 Q13442814 @default.
- Q74393792 P356 "10.1103/PHYSREVB.48.2175" @default.
- Q74393792 P407 Q1860 @default.
- Q74393792 P433 "4" @default.
- Q74393792 P478 "48" @default.
- Q74393792 P577 "1993-07-01T00:00:00Z" @default.
- Q74393792 P698 "10008609" @default.