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- Q74465614 description "artikull shkencor i botuar më 01 janar 1985" @default.
- Q74465614 description "artículu científicu espublizáu en xineru de 1985" @default.
- Q74465614 description "im Januar 1985 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74465614 description "scientific article published on 01 January 1985" @default.
- Q74465614 description "wetenschappelijk artikel" @default.
- Q74465614 description "наукова стаття, опублікована в січні 1985" @default.
- Q74465614 name "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 name "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 name "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 type Item @default.
- Q74465614 label "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 label "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 label "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 prefLabel "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 prefLabel "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 prefLabel "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 P1433 Q74465614-6FFB6298-311C-4E66-A69B-1CF3FCC5E1E8 @default.
- Q74465614 P1476 Q74465614-3D0157E8-54C4-49C6-A11D-FCD6A97BE4A9 @default.
- Q74465614 P2093 Q74465614-15F5F0B5-A57A-4683-B652-FC9277D5157A @default.
- Q74465614 P2093 Q74465614-8590ECC5-9939-4401-AD85-64A2398F6294 @default.
- Q74465614 P2093 Q74465614-9470ECEC-E8E3-4EC7-9612-5B9473D86530 @default.
- Q74465614 P2093 Q74465614-9B764692-C132-4269-BF3D-2716383AB451 @default.
- Q74465614 P2093 Q74465614-DCFE5529-FDC2-4185-A257-C2C3F6C52661 @default.
- Q74465614 P304 Q74465614-DD7C4DF9-4F98-4200-BB17-E2DD268129CE @default.
- Q74465614 P31 Q74465614-356969D4-6A43-4A9C-AA06-6DEFD2676843 @default.
- Q74465614 P356 Q74465614-77F0F1D1-715F-455D-B7FB-236D3EB493D2 @default.
- Q74465614 P407 Q74465614-E828E93D-63B2-43F2-A489-9D457CC699C0 @default.
- Q74465614 P433 Q74465614-DE3A74AA-285A-4D12-BACB-6C36F14EB76F @default.
- Q74465614 P478 Q74465614-921BC1DA-9E71-4D7F-B53B-A70AF395F266 @default.
- Q74465614 P577 Q74465614-22A22929-B8E8-48C1-AEC7-60CD02444B21 @default.
- Q74465614 P698 Q74465614-56190869-7A9C-45EC-8484-76E8F2288447 @default.
- Q74465614 P356 PHYSREVLETT.54.60 @default.
- Q74465614 P698 10030884 @default.
- Q74465614 P1433 Q2018386 @default.
- Q74465614 P1476 "Sensitivity-enhanced electron-holographic interferometry and thickness measurement applications at atomic scale" @default.
- Q74465614 P2093 "Endo J" @default.
- Q74465614 P2093 "Kawasaki T" @default.
- Q74465614 P2093 "Matsuda T" @default.
- Q74465614 P2093 "Osakabe N" @default.
- Q74465614 P2093 "Tonomura A" @default.
- Q74465614 P304 "60-62" @default.
- Q74465614 P31 Q13442814 @default.
- Q74465614 P356 "10.1103/PHYSREVLETT.54.60" @default.
- Q74465614 P407 Q1860 @default.
- Q74465614 P433 "1" @default.
- Q74465614 P478 "54" @default.
- Q74465614 P577 "1985-01-01T00:00:00Z" @default.
- Q74465614 P698 "10030884" @default.