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- Q74471102 description "article scientifique publié en 1986" @default.
- Q74471102 description "artículu científicu espublizáu en xineru de 1986" @default.
- Q74471102 description "bài báo khoa học" @default.
- Q74471102 description "im Januar 1986 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74471102 description "scientific article published on 01 January 1986" @default.
- Q74471102 description "wetenschappelijk artikel" @default.
- Q74471102 description "наукова стаття, опублікована в січні 1986" @default.
- Q74471102 name "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 name "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 name "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 type Item @default.
- Q74471102 label "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 label "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 label "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 prefLabel "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 prefLabel "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 prefLabel "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 P1104 Q74471102-56293AFB-97F9-4BE9-B48B-4F3CCFB5D056 @default.
- Q74471102 P1433 Q74471102-04E8A28E-7D79-4E50-8BC8-425A66085094 @default.
- Q74471102 P1476 Q74471102-84A2D290-DC73-4D96-B6E1-3EB040FAECB6 @default.
- Q74471102 P2093 Q74471102-4825DB0F-60D7-4607-807C-48D0D1CBCD70 @default.
- Q74471102 P2093 Q74471102-A50F8FC2-92F3-425E-BC56-071CFB12672F @default.
- Q74471102 P304 Q74471102-C74374BD-91F9-4540-A9BD-61D1E1B5B1E4 @default.
- Q74471102 P31 Q74471102-874B27F9-7F98-4101-95E1-ECFBCCF2E513 @default.
- Q74471102 P356 Q74471102-D64D88F7-0928-49B5-8B44-33E4B8F20A3E @default.
- Q74471102 P407 Q74471102-1B295AFF-BCD4-4C6F-B6AF-59DA6DCC54E7 @default.
- Q74471102 P433 Q74471102-A5773F84-F9E2-41CE-AA3F-99A42A187B1F @default.
- Q74471102 P478 Q74471102-0B57D2F7-97A5-4967-835E-5B7701825C94 @default.
- Q74471102 P577 Q74471102-DFB46474-7250-4905-B276-D07793D15C6F @default.
- Q74471102 P698 Q74471102-37248D7D-70CC-4ED1-99DC-B946568C7049 @default.
- Q74471102 P356 PHYSREVLETT.56.73 @default.
- Q74471102 P698 10032532 @default.
- Q74471102 P1104 "+4" @default.
- Q74471102 P1433 Q2018386 @default.
- Q74471102 P1476 "Determination of surface-defect concentration and distribution with He diffraction" @default.
- Q74471102 P2093 "Rieder KH" @default.
- Q74471102 P2093 "Schlup WA" @default.
- Q74471102 P304 "73-76" @default.
- Q74471102 P31 Q13442814 @default.
- Q74471102 P356 "10.1103/PHYSREVLETT.56.73" @default.
- Q74471102 P407 Q1860 @default.
- Q74471102 P433 "1" @default.
- Q74471102 P478 "56" @default.
- Q74471102 P577 "1986-01-01T00:00:00Z" @default.
- Q74471102 P698 "10032532" @default.