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- Q74477682 description "article scientifique publié en 1987" @default.
- Q74477682 description "artículu científicu espublizáu n'abril de 1987" @default.
- Q74477682 description "im April 1987 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74477682 description "scientific article published on 01 April 1987" @default.
- Q74477682 description "wetenschappelijk artikel" @default.
- Q74477682 description "наукова стаття, опублікована у квітні 1987" @default.
- Q74477682 name "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 name "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 type Item @default.
- Q74477682 label "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 label "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 prefLabel "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 prefLabel "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
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- Q74477682 P1476 Q74477682-E53FAE5E-5E0F-4769-A068-02ABE20FD972 @default.
- Q74477682 P2093 Q74477682-85FF42C4-C610-4C88-AE71-02FC364C3CB3 @default.
- Q74477682 P2860 Q74477682-8FEC6331-91FB-4492-AD6E-F67E4113D26D @default.
- Q74477682 P304 Q74477682-F06DB268-775C-4C2B-97BD-DD8BE217EAB5 @default.
- Q74477682 P31 Q74477682-072D871E-8750-4FDC-887B-5A70F258F243 @default.
- Q74477682 P356 Q74477682-56506B86-9613-4D7E-9665-C3BCC00C3C43 @default.
- Q74477682 P407 Q74477682-F10259CE-2506-4FEA-9562-51845294FA11 @default.
- Q74477682 P433 Q74477682-D69E4CDE-CF3A-4B2B-AC9F-33BF5DAD4930 @default.
- Q74477682 P478 Q74477682-CF1EAE48-A3C5-492D-9995-5C521E7D3B2C @default.
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- Q74477682 P577 Q74477682-0824E1EA-F55E-4682-9548-4DF905A64296 @default.
- Q74477682 P698 Q74477682-88F8E064-0B94-4191-82D9-9C5278E2EED4 @default.
- Q74477682 P356 PHYSREVLETT.58.1687 @default.
- Q74477682 P698 10034508 @default.
- Q74477682 P1433 Q2018386 @default.
- Q74477682 P1476 "Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctions" @default.
- Q74477682 P2093 "Wakai RT" @default.
- Q74477682 P2860 Q74470863 @default.
- Q74477682 P304 "1687-1690" @default.
- Q74477682 P31 Q13442814 @default.
- Q74477682 P356 "10.1103/PHYSREVLETT.58.1687" @default.
- Q74477682 P407 Q1860 @default.
- Q74477682 P433 "16" @default.
- Q74477682 P478 "58" @default.
- Q74477682 P50 Q29948847 @default.
- Q74477682 P577 "1987-04-01T00:00:00Z" @default.
- Q74477682 P698 "10034508" @default.