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- Q74496133 description "article scientifique publié en 1989" @default.
- Q74496133 description "artikull shkencor i botuar më 01 janar 1989" @default.
- Q74496133 description "artículu científicu espublizáu en xineru de 1989" @default.
- Q74496133 description "im Januar 1989 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74496133 description "scientific article published on 01 January 1989" @default.
- Q74496133 description "wetenschappelijk artikel" @default.
- Q74496133 description "наукова стаття, опублікована в січні 1989" @default.
- Q74496133 name "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 name "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 name "Quantitative structural determination of metallic film growth on a semiconductor crystal:" @default.
- Q74496133 type Item @default.
- Q74496133 label "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 label "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 label "Quantitative structural determination of metallic film growth on a semiconductor crystal:" @default.
- Q74496133 prefLabel "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 prefLabel "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 prefLabel "Quantitative structural determination of metallic film growth on a semiconductor crystal:" @default.
- Q74496133 P1433 Q74496133-31BB0905-950A-4052-878A-379F611C3B45 @default.
- Q74496133 P1476 Q74496133-770A8768-FB55-4182-99BB-CFA0D4F9F59F @default.
- Q74496133 P2093 Q74496133-29E7D45F-DD34-4FDC-9EC4-DB462026A5A9 @default.
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- Q74496133 P304 Q74496133-A2870AB5-6E7A-41BC-BE88-BDDA2B0C0357 @default.
- Q74496133 P31 Q74496133-54A3E4D2-1617-46FA-B9F2-1DB152821F18 @default.
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- Q74496133 P407 Q74496133-039A04C1-E093-4229-8961-6ED17B7BD91D @default.
- Q74496133 P433 Q74496133-5AC25615-8DB0-4426-8149-49483D5D1371 @default.
- Q74496133 P478 Q74496133-8E7DF018-B0F6-4756-9F57-5F8B71BA599F @default.
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- Q74496133 P698 Q74496133-59F2511F-3CE4-4FE4-AB43-D8CA5C498687 @default.
- Q74496133 P356 PHYSREVLETT.62.559 @default.
- Q74496133 P698 10040266 @default.
- Q74496133 P1433 Q2018386 @default.
- Q74496133 P1476 "Quantitative structural determination of metallic film growth on a semiconductor crystal: ( sqrt 3-bar x sqrt 3-bar)R 30 degrees -->(1 x 1) Pb on Ge (111)" @default.
- Q74496133 P2093 "Huang H" @default.
- Q74496133 P2093 "Li H" @default.
- Q74496133 P2093 "Tong SY" @default.
- Q74496133 P2093 "Tonner BP" @default.
- Q74496133 P2093 "Wei CM" @default.
- Q74496133 P2860 Q54393868 @default.
- Q74496133 P2860 Q77988765 @default.
- Q74496133 P304 "559-562" @default.
- Q74496133 P31 Q13442814 @default.
- Q74496133 P356 "10.1103/PHYSREVLETT.62.559" @default.
- Q74496133 P407 Q1860 @default.
- Q74496133 P433 "5" @default.
- Q74496133 P478 "62" @default.
- Q74496133 P50 Q90045973 @default.
- Q74496133 P577 "1989-01-01T00:00:00Z" @default.
- Q74496133 P698 "10040266" @default.