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- Q74570886 description "artículu científicu espublizáu en setiembre de 1996" @default.
- Q74570886 description "im September 1996 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74570886 description "scientific article published on 01 September 1996" @default.
- Q74570886 description "wetenschappelijk artikel" @default.
- Q74570886 description "наукова стаття, опублікована у вересні 1996" @default.
- Q74570886 name "Photoemission Extended Fine Structure Study of the SiO2/Si" @default.
- Q74570886 name "Photoemission Extended Fine Structure Study of the SiO2/Si(111) Interface" @default.
- Q74570886 type Item @default.
- Q74570886 label "Photoemission Extended Fine Structure Study of the SiO2/Si" @default.
- Q74570886 label "Photoemission Extended Fine Structure Study of the SiO2/Si(111) Interface" @default.
- Q74570886 prefLabel "Photoemission Extended Fine Structure Study of the SiO2/Si" @default.
- Q74570886 prefLabel "Photoemission Extended Fine Structure Study of the SiO2/Si(111) Interface" @default.
- Q74570886 P1433 Q74570886-6B892847-EEEA-4D97-8131-CAA0E98F63D6 @default.
- Q74570886 P1476 Q74570886-88F0DF5F-FE5B-41E3-B161-0E92194BEC2C @default.
- Q74570886 P2093 Q74570886-3E8799D4-6CBA-419D-8BA1-0A82CD9B127F @default.
- Q74570886 P2093 Q74570886-5C04DD51-90EE-4415-A7C5-38F1198E8613 @default.
- Q74570886 P2093 Q74570886-8A487F0F-A8D7-4412-AA67-3098A19EA232 @default.
- Q74570886 P2093 Q74570886-FB2DF546-1A86-4CC0-9A0C-103CAD5A0177 @default.
- Q74570886 P304 Q74570886-8C8ACDD3-2A4A-4CE2-BEDE-16E561650A5A @default.
- Q74570886 P31 Q74570886-48A7D178-A507-411D-AE3E-DECD943DB4B9 @default.
- Q74570886 P356 Q74570886-9EB26CF5-B23D-4055-A702-F83EA7DC85C6 @default.
- Q74570886 P407 Q74570886-61D7DEED-430F-498E-8A1C-C547617CA56F @default.
- Q74570886 P433 Q74570886-47EC9C9D-78A6-4F0F-869D-205681408F5E @default.
- Q74570886 P478 Q74570886-555BC87F-4BFE-46E8-AA08-1E331C7DA814 @default.
- Q74570886 P577 Q74570886-ADD2BAB3-F139-4946-97BA-8FDD648F7E4F @default.
- Q74570886 P698 Q74570886-D7E35A30-41D7-4AE5-99E6-50765DFF3073 @default.
- Q74570886 P356 PHYSREVLETT.77.2758 @default.
- Q74570886 P698 10062038 @default.
- Q74570886 P1433 Q2018386 @default.
- Q74570886 P1476 "Photoemission Extended Fine Structure Study of the SiO2/Si(111) Interface" @default.
- Q74570886 P2093 "Chiang T" @default.
- Q74570886 P2093 "Luh DA" @default.
- Q74570886 P2093 "Miller T" @default.
- Q74570886 P2093 "Sieger MT" @default.
- Q74570886 P304 "2758-2761" @default.
- Q74570886 P31 Q13442814 @default.
- Q74570886 P356 "10.1103/PHYSREVLETT.77.2758" @default.
- Q74570886 P407 Q1860 @default.
- Q74570886 P433 "13" @default.
- Q74570886 P478 "77" @default.
- Q74570886 P577 "1996-09-01T00:00:00Z" @default.
- Q74570886 P698 "10062038" @default.