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- Q74799176 description "article scientifique publié en septembre 2002" @default.
- Q74799176 description "artículu científicu espublizáu en setiembre de 2002" @default.
- Q74799176 description "im September 2002 veröffentlichter wissenschaftlicher Artikel" @default.
- Q74799176 description "scientific article published on 01 September 2002" @default.
- Q74799176 description "wetenschappelijk artikel" @default.
- Q74799176 description "наукова стаття, опублікована у вересні 2002" @default.
- Q74799176 name "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 name "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 type Item @default.
- Q74799176 label "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 label "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 prefLabel "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 prefLabel "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 P1433 Q74799176-EBCB52B4-08C8-41E1-BFF4-0F898BFD8432 @default.
- Q74799176 P1476 Q74799176-099B3132-2E80-4F96-AA5C-DBE522F8C441 @default.
- Q74799176 P2093 Q74799176-176BB68F-A430-4FBE-9985-47E8F299CCC1 @default.
- Q74799176 P2093 Q74799176-2217C2DD-E351-4C48-8D29-A7D6AD0E795D @default.
- Q74799176 P2093 Q74799176-F56D3EFB-6F65-49E6-899A-B8940CDBD304 @default.
- Q74799176 P2093 Q74799176-F7987364-526F-4A12-AE01-7DAE537EFAF6 @default.
- Q74799176 P304 Q74799176-94E3D6BB-46F2-4B9A-9AC8-71DD057DCC9B @default.
- Q74799176 P31 Q74799176-62E10BEE-DD8B-406F-B297-2120B7373D6D @default.
- Q74799176 P356 Q74799176-411C2482-7F6B-4965-9D35-7035A1111C9E @default.
- Q74799176 P433 Q74799176-6DB1C7D2-3AB9-4278-A6D9-B799953474DE @default.
- Q74799176 P478 Q74799176-36980C1D-E45C-43F2-9C0F-156DACB12414 @default.
- Q74799176 P577 Q74799176-F8DD6161-152F-4D12-B007-E106579D7E84 @default.
- Q74799176 P698 Q74799176-284F4258-169A-4142-84FD-9482CCBAD630 @default.
- Q74799176 P356 AC025720Y @default.
- Q74799176 P698 12236366 @default.
- Q74799176 P1433 Q485223 @default.
- Q74799176 P1476 "Wavelength-dispersive total-reflection X-ray fluorescence with an efficient Johansson spectrometer and an undulator X-ray source: detection of 10-16 g-level trace metals" @default.
- Q74799176 P2093 "Hiromi Eba" @default.
- Q74799176 P2093 "Katsuaki Inoue" @default.
- Q74799176 P2093 "Kenji Sakurai" @default.
- Q74799176 P2093 "Naoto Yagi" @default.
- Q74799176 P304 "4532-4535" @default.
- Q74799176 P31 Q13442814 @default.
- Q74799176 P356 "10.1021/AC025720Y" @default.
- Q74799176 P433 "17" @default.
- Q74799176 P478 "74" @default.
- Q74799176 P577 "2002-09-01T00:00:00Z" @default.
- Q74799176 P698 "12236366" @default.