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- Q78219374 description "artículu científicu espublizáu en xunetu de 1991" @default.
- Q78219374 description "im Juli 1991 veröffentlichter wissenschaftlicher Artikel" @default.
- Q78219374 description "scientific article published on 01 July 1991" @default.
- Q78219374 description "wetenschappelijk artikel" @default.
- Q78219374 description "наукова стаття, опублікована в липні 1991" @default.
- Q78219374 name "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 name "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 type Item @default.
- Q78219374 label "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 label "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 prefLabel "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 prefLabel "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 P1104 Q78219374-5BEEA164-1B7E-451C-BFA9-F293B12A1D70 @default.
- Q78219374 P1433 Q78219374-3A9A2684-9E99-4A63-B6EA-04DAFD53B314 @default.
- Q78219374 P1476 Q78219374-CB676FBB-A139-44BC-9005-A28009AE9EA6 @default.
- Q78219374 P2093 Q78219374-13D5451F-41CC-4F2E-B626-1EE0BA77D2B6 @default.
- Q78219374 P2093 Q78219374-4165FF0C-BDC3-469C-B983-598B78A4812C @default.
- Q78219374 P2093 Q78219374-6AD97A37-012C-4F42-A8A8-6C6F2F3DC4E5 @default.
- Q78219374 P304 Q78219374-3E92117F-ACD4-4901-B716-0EFA51448520 @default.
- Q78219374 P31 Q78219374-A71BFBCE-556D-45EA-86EF-837D36A2B935 @default.
- Q78219374 P356 Q78219374-0E886E8E-B328-4D2C-992F-093EB0C11738 @default.
- Q78219374 P407 Q78219374-180DF924-BDF4-4668-A386-0DC765DBE524 @default.
- Q78219374 P433 Q78219374-666B4235-C853-43A8-8341-3AFC14FDC64C @default.
- Q78219374 P478 Q78219374-36CB1663-A3CF-4C1F-A1D0-54C28ABC3E82 @default.
- Q78219374 P577 Q78219374-4CF544E0-1DC6-441B-9E50-D1C40F1B0C39 @default.
- Q78219374 P698 Q78219374-F6028C74-69B5-40CC-8A0A-D51D9324F43D @default.
- Q78219374 P356 PHYSREVB.44.1616 @default.
- Q78219374 P698 9999695 @default.
- Q78219374 P1104 "+6" @default.
- Q78219374 P1433 Q2284414 @default.
- Q78219374 P1476 "Evaluation of SiO2/(001)Si interface roughness using high-resolution transmission electron microscopy and simulation" @default.
- Q78219374 P2093 "Akatsu H" @default.
- Q78219374 P2093 "Ohdomari I I" @default.
- Q78219374 P2093 "Sumi Y" @default.
- Q78219374 P304 "1616-1621" @default.
- Q78219374 P31 Q13442814 @default.
- Q78219374 P356 "10.1103/PHYSREVB.44.1616" @default.
- Q78219374 P407 Q1860 @default.
- Q78219374 P433 "4" @default.
- Q78219374 P478 "44" @default.
- Q78219374 P577 "1991-07-01T00:00:00Z" @default.
- Q78219374 P698 "9999695" @default.