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- Q79881541 description "article scientifique publié en 2004" @default.
- Q79881541 description "artículu científicu espublizáu n'abril de 2004" @default.
- Q79881541 description "im April 2004 veröffentlichter wissenschaftlicher Artikel" @default.
- Q79881541 description "scientific article published on 06 April 2004" @default.
- Q79881541 description "wetenschappelijk artikel" @default.
- Q79881541 description "наукова стаття, опублікована у квітні 2004" @default.
- Q79881541 name "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 name "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 type Item @default.
- Q79881541 label "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 label "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 prefLabel "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 prefLabel "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 P1433 Q79881541-F4650933-A274-4702-9615-2A43688D6D02 @default.
- Q79881541 P1476 Q79881541-A8388613-6E3F-4334-B122-539B0013C208 @default.
- Q79881541 P2093 Q79881541-0455C904-18CE-410E-9C51-F64F7C47DA13 @default.
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- Q79881541 P2093 Q79881541-9C2D28A8-C11D-4149-A1AC-26161654D316 @default.
- Q79881541 P2093 Q79881541-E74A93CF-0DC9-41E1-87A7-E74C36E87EEA @default.
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- Q79881541 P304 Q79881541-D43F4F11-D9E2-46DD-A18A-5C732D91708C @default.
- Q79881541 P31 Q79881541-C7522C9D-181F-42CA-9E05-1E254BAC5C8C @default.
- Q79881541 P356 Q79881541-095A8296-40BF-43F7-A882-D60C5ADB073F @default.
- Q79881541 P407 Q79881541-C7D62FBC-077E-4859-9EAA-CE2FDFA42A10 @default.
- Q79881541 P433 Q79881541-6C7F008D-48DA-4981-B156-7755F26B510F @default.
- Q79881541 P478 Q79881541-B0210EA5-7D2E-4556-BC17-75659EF576AA @default.
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- Q79881541 P698 Q79881541-40B2ABE8-98AD-4446-9D0E-9CDF09D27CE2 @default.
- Q79881541 P356 S00216-004-2602-5 @default.
- Q79881541 P698 15067495 @default.
- Q79881541 P1433 Q2845280 @default.
- Q79881541 P1476 "Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates" @default.
- Q79881541 P2093 "H-J Engelmann" @default.
- Q79881541 P2093 "K Wetzig" @default.
- Q79881541 P2093 "M Hecker" @default.
- Q79881541 P2093 "N Mattern" @default.
- Q79881541 P2093 "R Hübner" @default.
- Q79881541 P2093 "V Hoffmann" @default.
- Q79881541 P2888 s00216-004-2602-5 @default.
- Q79881541 P304 "568-575" @default.
- Q79881541 P31 Q13442814 @default.
- Q79881541 P356 "10.1007/S00216-004-2602-5" @default.
- Q79881541 P407 Q1860 @default.
- Q79881541 P433 "4" @default.
- Q79881541 P478 "379" @default.
- Q79881541 P50 Q66458923 @default.
- Q79881541 P577 "2004-04-06T00:00:00Z" @default.
- Q79881541 P698 "15067495" @default.