Matches in Wikidata for { <http://www.wikidata.org/entity/Q81035321> ?p ?o ?g. }
Showing items 1 to 42 of
42
with 100 items per page.
- Q81035321 description "artículu científicu espublizáu en febreru de 2008" @default.
- Q81035321 description "im Februar 2008 veröffentlichter wissenschaftlicher Artikel" @default.
- Q81035321 description "scientific article published on 29 February 2008" @default.
- Q81035321 description "wetenschappelijk artikel" @default.
- Q81035321 description "наукова стаття, опублікована в лютому 2008" @default.
- Q81035321 name "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 name "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 type Item @default.
- Q81035321 label "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 label "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 prefLabel "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 prefLabel "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 P1433 Q81035321-9162C591-C698-42F2-B7C7-AC2A73B64CC9 @default.
- Q81035321 P1476 Q81035321-3D2D6BA0-8594-4DFF-8115-5C4729DAE98F @default.
- Q81035321 P2093 Q81035321-06193F0A-1128-4944-8E12-92E93E704E1B @default.
- Q81035321 P2093 Q81035321-0CA85891-40C4-40B4-ADE2-2ED45FEBA0E5 @default.
- Q81035321 P2093 Q81035321-9F128116-A1DD-463C-B8C8-6F6D028AF382 @default.
- Q81035321 P304 Q81035321-B1919F08-2448-4E87-88F3-5911E730C4B6 @default.
- Q81035321 P31 Q81035321-C2CC3341-FFD9-43EB-AD37-73052FA19554 @default.
- Q81035321 P356 Q81035321-D3DEB2D2-4E97-4A5E-91B8-6FC1A71950ED @default.
- Q81035321 P433 Q81035321-43561AB3-0A8E-4207-9045-58ACE08E8033 @default.
- Q81035321 P478 Q81035321-8834D207-EC4C-43C0-9682-00E3E3B71D28 @default.
- Q81035321 P50 Q81035321-A3FA22BB-9E52-47BC-82D1-38930F6CB8DF @default.
- Q81035321 P50 Q81035321-ED4D1E84-FF36-45B5-ADDC-A3F1043A0617 @default.
- Q81035321 P577 Q81035321-3E582062-88F0-4A3A-A3AE-1B02E7BDA301 @default.
- Q81035321 P698 Q81035321-F260BE5A-1A84-4EB8-84D4-D52E24A3076B @default.
- Q81035321 P356 J.MICRON.2008.02.012 @default.
- Q81035321 P698 18394908 @default.
- Q81035321 P1433 Q6839708 @default.
- Q81035321 P1476 "Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction method" @default.
- Q81035321 P2093 "A Czerwinski" @default.
- Q81035321 P2093 "M Wzorek" @default.
- Q81035321 P2093 "R Dylewicz" @default.
- Q81035321 P304 "37-40" @default.
- Q81035321 P31 Q13442814 @default.
- Q81035321 P356 "10.1016/J.MICRON.2008.02.012" @default.
- Q81035321 P433 "1" @default.
- Q81035321 P478 "40" @default.
- Q81035321 P50 Q56501573 @default.
- Q81035321 P50 Q79353468 @default.
- Q81035321 P577 "2008-02-29T00:00:00Z" @default.
- Q81035321 P698 "18394908" @default.