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- Q81470670 description "2005 թվականի նոյեմբերի 11-ին հրատարակված գիտական հոդված" @default.
- Q81470670 description "article scientifique publié en 2005" @default.
- Q81470670 description "artículu científicu espublizáu en payares de 2005" @default.
- Q81470670 description "im November 2005 veröffentlichter wissenschaftlicher Artikel" @default.
- Q81470670 description "scientific article published on 11 November 2005" @default.
- Q81470670 description "wetenschappelijk artikel" @default.
- Q81470670 description "наукова стаття, опублікована в листопаді 2005" @default.
- Q81470670 name "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 name "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 type Item @default.
- Q81470670 label "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 label "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 prefLabel "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 prefLabel "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 P1433 Q81470670-9C0E019E-8544-4A0D-9CE7-6AB90E3CC23F @default.
- Q81470670 P1476 Q81470670-98B5E114-7B79-4BB4-B3CA-19F7BED12961 @default.
- Q81470670 P2093 Q81470670-1A42DB0A-08C2-4308-9405-515AD3B8B571 @default.
- Q81470670 P2093 Q81470670-70E54411-DAFA-483A-87BF-39929255DCCF @default.
- Q81470670 P2888 Q81470670-59A00317-EC25-47F5-B276-005DFEAD52CE @default.
- Q81470670 P304 Q81470670-BB7D7B5F-8124-42F4-AE39-925B0D7FF35B @default.
- Q81470670 P31 Q81470670-A481865D-41D1-4EA2-B63C-3C366399C86F @default.
- Q81470670 P356 Q81470670-7647AD7A-13A5-41B1-8E2B-18447AD177EE @default.
- Q81470670 P407 Q81470670-18A59AC5-DCFB-4FDE-813E-9B45048FB079 @default.
- Q81470670 P433 Q81470670-A8480568-0F75-435B-8C4D-F31C3DFD5892 @default.
- Q81470670 P478 Q81470670-010EC87B-65DE-4602-9338-35CDCD91B60D @default.
- Q81470670 P50 Q81470670-0400E508-44CF-4AAE-A3F0-95835DEC3995 @default.
- Q81470670 P50 Q81470670-58D181E8-08D3-4FB9-B287-D3B59B5C9FE8 @default.
- Q81470670 P50 Q81470670-D94641FB-3FDA-4148-99FB-2FAF7041EB81 @default.
- Q81470670 P577 Q81470670-22FF5CB0-E660-4DE4-80CD-8D15B434FBAF @default.
- Q81470670 P698 Q81470670-7703C6AF-DCD1-4FB6-985B-9EA3A52ED600 @default.
- Q81470670 P921 Q81470670-B41147D1-087D-43CA-954E-CEF53E974CA0 @default.
- Q81470670 P356 S00216-005-0123-5 @default.
- Q81470670 P698 16283268 @default.
- Q81470670 P1433 Q2845280 @default.
- Q81470670 P1476 "In-depth profile analysis of thin films deposited on non-conducting glasses by radiofrequency glow-discharge-optical emission spectrometry" @default.
- Q81470670 P2093 "Antonio Martín" @default.
- Q81470670 P2093 "Nerea Bordel" @default.
- Q81470670 P2888 s00216-005-0123-5 @default.
- Q81470670 P304 "876-886" @default.
- Q81470670 P31 Q13442814 @default.
- Q81470670 P356 "10.1007/S00216-005-0123-5" @default.
- Q81470670 P407 Q1860 @default.
- Q81470670 P433 "4" @default.
- Q81470670 P478 "384" @default.
- Q81470670 P50 Q37828936 @default.
- Q81470670 P50 Q50916060 @default.
- Q81470670 P50 Q73185998 @default.
- Q81470670 P577 "2005-11-11T00:00:00Z" @default.
- Q81470670 P698 "16283268" @default.
- Q81470670 P921 Q1137203 @default.