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- Q81577257 description "article scientifique publié en 2005" @default.
- Q81577257 description "artículu científicu espublizáu n'agostu de 2005" @default.
- Q81577257 description "im August 2005 veröffentlichter wissenschaftlicher Artikel" @default.
- Q81577257 description "scientific article published on 01 August 2005" @default.
- Q81577257 description "wetenschappelijk artikel" @default.
- Q81577257 description "наукова стаття, опублікована в серпні 2005" @default.
- Q81577257 name "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 name "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 type Item @default.
- Q81577257 label "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 label "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 prefLabel "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 prefLabel "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 P1433 Q81577257-3E8D4678-220A-4895-BA4E-1F7D452FEA2C @default.
- Q81577257 P1476 Q81577257-4CA1351A-3807-4A44-8D30-6CC8BCCD7574 @default.
- Q81577257 P2093 Q81577257-0F5BB8D6-B2AC-404F-B1C2-A1ABE32B916E @default.
- Q81577257 P2093 Q81577257-B6E8F32C-421B-45D0-86E9-837D84903D5F @default.
- Q81577257 P2093 Q81577257-DFF466B5-5368-4B8D-A95D-7EA7B7EC11AD @default.
- Q81577257 P2093 Q81577257-E1D512BB-7E93-443A-A3F9-86F83A7794E0 @default.
- Q81577257 P304 Q81577257-9F22E136-9534-4E50-B632-67C3644A632A @default.
- Q81577257 P31 Q81577257-016F1059-B015-4BDC-8C3A-6EABEDEF3F2B @default.
- Q81577257 P433 Q81577257-818862F1-1AA0-46DA-8494-B40CB0A9BA02 @default.
- Q81577257 P478 Q81577257-C47CCCEC-D495-46A8-86AB-7F1EED35E3FE @default.
- Q81577257 P577 Q81577257-0FAA86AA-EE38-4196-8036-2D935C9578FA @default.
- Q81577257 P698 Q81577257-3DBBE11F-ED6C-4132-9AB2-6203E8A2A170 @default.
- Q81577257 P698 16329488 @default.
- Q81577257 P1433 Q26842485 @default.
- Q81577257 P1476 "[Analysis of reflective IR transmittance spectra at oblique incidence of micrometer SiO2 films on c-Si substrate]" @default.
- Q81577257 P2093 "Kui-xun Lin" @default.
- Q81577257 P2093 "Shun-hui Lin" @default.
- Q81577257 P2093 "Xuan-ying Lin" @default.
- Q81577257 P2093 "Yun-peng Yu" @default.
- Q81577257 P304 "1234-1236" @default.
- Q81577257 P31 Q13442814 @default.
- Q81577257 P433 "8" @default.
- Q81577257 P478 "25" @default.
- Q81577257 P577 "2005-08-01T00:00:00Z" @default.
- Q81577257 P698 "16329488" @default.