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- Q81801757 description "artículu científicu espublizáu n'ochobre de 2005" @default.
- Q81801757 description "im Oktober 2005 veröffentlichter wissenschaftlicher Artikel" @default.
- Q81801757 description "scientific article published on 01 October 2005" @default.
- Q81801757 description "wetenschappelijk artikel" @default.
- Q81801757 description "наукова стаття, опублікована в жовтні 2005" @default.
- Q81801757 name "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 name "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 type Item @default.
- Q81801757 label "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 label "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 prefLabel "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 prefLabel "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 P1433 Q81801757-9212A354-4258-4224-B6A4-C100FD3E5691 @default.
- Q81801757 P1476 Q81801757-12F93CB1-F6FF-4E49-83FF-490363D56806 @default.
- Q81801757 P2093 Q81801757-8E8D4A0A-DD16-4EB2-AA4D-C53649CA8978 @default.
- Q81801757 P2093 Q81801757-9564AE84-80A5-422C-AD0B-23CC6B645590 @default.
- Q81801757 P2093 Q81801757-FA8AED62-617D-44F4-91DA-F6079137312F @default.
- Q81801757 P2860 Q81801757-45E751B7-DDB5-4CDF-B56E-4D73E79E3DDA @default.
- Q81801757 P2860 Q81801757-849C15B3-1E2D-46C4-8F5C-3136435344F2 @default.
- Q81801757 P2860 Q81801757-9C7C7721-A66A-4C77-83B9-F991927F70A9 @default.
- Q81801757 P2860 Q81801757-A021A786-CD44-4A92-A5CB-232FE4266498 @default.
- Q81801757 P2860 Q81801757-EDC50C98-437D-46C0-8745-5DD224F59015 @default.
- Q81801757 P2860 Q81801757-F9890099-A07B-4A7E-8802-CB8D362F4974 @default.
- Q81801757 P304 Q81801757-3565306C-76F1-4419-A67F-13BADB47C922 @default.
- Q81801757 P31 Q81801757-2AC67CEF-7598-4C8A-91C0-7259DA4E9C1A @default.
- Q81801757 P356 Q81801757-5C5ECB61-62DA-4693-BD24-6E3CCA22648B @default.
- Q81801757 P433 Q81801757-20242DAE-8E86-4063-8C6C-FEEA8FB1BB11 @default.
- Q81801757 P478 Q81801757-2F19B9A8-2282-4AAE-9704-8459FFDBAB77 @default.
- Q81801757 P50 Q81801757-09ECBEF5-F85F-4D00-A200-7EF823561EAB @default.
- Q81801757 P577 Q81801757-58AD3292-0613-4E41-A490-E63BD915BCB7 @default.
- Q81801757 P698 Q81801757-3BBD4F72-9E92-4C65-BAF4-43BEC5241742 @default.
- Q81801757 P356 J.ULTRAMIC.2005.04.004 @default.
- Q81801757 P698 15927397 @default.
- Q81801757 P1433 Q7880603 @default.
- Q81801757 P1476 "Focused ion beam-nanomachined probes for improved electric force microscopy" @default.
- Q81801757 P2093 "Claudia Menozzi" @default.
- Q81801757 P2093 "Gian Carlo Gazzadi" @default.
- Q81801757 P2093 "Paolo Facci" @default.
- Q81801757 P2860 Q21563713 @default.
- Q81801757 P2860 Q34115531 @default.
- Q81801757 P2860 Q52941500 @default.
- Q81801757 P2860 Q56429694 @default.
- Q81801757 P2860 Q62113392 @default.
- Q81801757 P2860 Q63407126 @default.
- Q81801757 P304 "220-225" @default.
- Q81801757 P31 Q13442814 @default.
- Q81801757 P356 "10.1016/J.ULTRAMIC.2005.04.004" @default.
- Q81801757 P433 "3-4" @default.
- Q81801757 P478 "104" @default.
- Q81801757 P50 Q58209474 @default.
- Q81801757 P577 "2005-10-01T00:00:00Z" @default.
- Q81801757 P698 "15927397" @default.