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- Q82410842 description "artículu científicu espublizáu n'avientu de 2009" @default.
- Q82410842 description "im Dezember 2009 veröffentlichter wissenschaftlicher Artikel" @default.
- Q82410842 description "scientific article published on 01 December 2009" @default.
- Q82410842 description "wetenschappelijk artikel" @default.
- Q82410842 description "наукова стаття, опублікована в грудні 2009" @default.
- Q82410842 name "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 name "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 type Item @default.
- Q82410842 label "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 label "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 prefLabel "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 prefLabel "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 P1433 Q82410842-05048DA6-43DB-4A97-A3E9-BE1ED26E09A3 @default.
- Q82410842 P1476 Q82410842-F88027E2-BCC6-4E80-92F6-69B83C8FBA47 @default.
- Q82410842 P2093 Q82410842-232163A2-F056-48EB-90DC-2D16C2611353 @default.
- Q82410842 P2093 Q82410842-39CF8085-E426-481B-B967-CA6F5C1D108E @default.
- Q82410842 P2093 Q82410842-4384B758-6EF1-4CEA-9280-EAF533A7D610 @default.
- Q82410842 P2093 Q82410842-C62AA4A8-A81E-4AEB-8105-07A85008C98A @default.
- Q82410842 P304 Q82410842-CEEF24C1-9C7C-40A0-861A-F86D92DEE698 @default.
- Q82410842 P31 Q82410842-50AD5B4D-77AF-4ECB-A21A-65D78DB882E6 @default.
- Q82410842 P356 Q82410842-E47DF140-680F-4214-9B8A-F7033EAC4995 @default.
- Q82410842 P433 Q82410842-9FBF80EE-4E71-4176-A9C0-163241CEDFBF @default.
- Q82410842 P478 Q82410842-12158300-CB8E-4A53-B68F-15C939CF058C @default.
- Q82410842 P50 Q82410842-8DACFAC1-87A1-4452-BEC1-23F91DBA96EF @default.
- Q82410842 P50 Q82410842-EF9D6108-B07D-4344-86D1-C19084F8066F @default.
- Q82410842 P577 Q82410842-2A732C3C-37A4-434E-957C-2C86E7E8A797 @default.
- Q82410842 P698 Q82410842-8F824632-1AEB-4109-B6C3-117F9C882ECA @default.
- Q82410842 P356 OE.17.022351 @default.
- Q82410842 P698 20052158 @default.
- Q82410842 P1433 Q3354459 @default.
- Q82410842 P1476 "Nanoscale residual stress-field mappingaround nanoindents in SiCby IR s-SNOM and confocal Raman microscopy" @default.
- Q82410842 P2093 "Alexander M Gigler" @default.
- Q82410842 P2093 "Alexander Ziegler" @default.
- Q82410842 P2093 "Andreas J Huber" @default.
- Q82410842 P2093 "Michael Bauer" @default.
- Q82410842 P304 "22351-22357" @default.
- Q82410842 P31 Q13442814 @default.
- Q82410842 P356 "10.1364/OE.17.022351" @default.
- Q82410842 P433 "25" @default.
- Q82410842 P478 "17" @default.
- Q82410842 P50 Q40802407 @default.
- Q82410842 P50 Q54288996 @default.
- Q82410842 P577 "2009-12-01T00:00:00Z" @default.
- Q82410842 P698 "20052158" @default.