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- Q82608173 description "article scientifique publié en 2011" @default.
- Q82608173 description "artículu científicu espublizáu n'agostu de 2011" @default.
- Q82608173 description "scientific article published on 01 August 2011" @default.
- Q82608173 description "wetenschappelijk artikel" @default.
- Q82608173 description "наукова стаття, опублікована в серпні 2011" @default.
- Q82608173 name "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 name "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 type Item @default.
- Q82608173 label "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 label "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 prefLabel "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 prefLabel "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 P1433 Q82608173-B4188E27-DE04-4317-A559-A5DD4DDA2711 @default.
- Q82608173 P1476 Q82608173-FEC5A06B-7293-43B7-A563-9633CD6F9E53 @default.
- Q82608173 P2093 Q82608173-0E49DC18-17D5-47D8-A591-8156185419FE @default.
- Q82608173 P2093 Q82608173-53E2CD41-3B04-431C-ADB0-3CB6090A84A4 @default.
- Q82608173 P2093 Q82608173-88CC9543-6A60-40B3-93AF-7B9D78762C2F @default.
- Q82608173 P2093 Q82608173-A1DD3153-AED1-4F59-86C6-2027B2C675C1 @default.
- Q82608173 P2093 Q82608173-B3689496-6149-406A-852B-30F8C62942CA @default.
- Q82608173 P2093 Q82608173-E4F5B9BB-F72D-4DCA-9AF7-AF1F6F515E7A @default.
- Q82608173 P304 Q82608173-44A9D537-7EC5-491D-96C3-C35F2618517E @default.
- Q82608173 P31 Q82608173-3880A079-6C7E-4F01-B965-FA6027F958AA @default.
- Q82608173 P356 Q82608173-DDE533C0-99D3-4A58-8E4A-F8FC6BD81CF4 @default.
- Q82608173 P407 Q82608173-2C56E7AF-D71E-48E7-B2D4-E11C56F8A681 @default.
- Q82608173 P433 Q82608173-19FD8AA5-972D-4773-A2FB-10C7D339E7E5 @default.
- Q82608173 P478 Q82608173-C97B608E-6C11-45CA-A03E-B27496434187 @default.
- Q82608173 P577 Q82608173-E516BBE9-8F9C-45F6-9501-01FB9DF15C49 @default.
- Q82608173 P698 Q82608173-6569DCDA-E458-4977-8DC9-471D0DC0FDE0 @default.
- Q82608173 P356 JNN.2011.4851 @default.
- Q82608173 P698 22103191 @default.
- Q82608173 P1433 Q2364336 @default.
- Q82608173 P1476 "Electrical characterization of n/p-type nickel silicide/silicon junctions by Sb segregation" @default.
- Q82608173 P2093 "Moongyu Jang" @default.
- Q82608173 P2093 "Myungsim Jun" @default.
- Q82608173 P2093 "Sung-Jin Choi" @default.
- Q82608173 P2093 "Taehyung Zyung" @default.
- Q82608173 P2093 "Younghoon Hyun" @default.
- Q82608173 P2093 "Youngsam Park" @default.
- Q82608173 P304 "7339-7342" @default.
- Q82608173 P31 Q13442814 @default.
- Q82608173 P356 "10.1166/JNN.2011.4851" @default.
- Q82608173 P407 Q1860 @default.
- Q82608173 P433 "8" @default.
- Q82608173 P478 "11" @default.
- Q82608173 P577 "2011-08-01T00:00:00Z" @default.
- Q82608173 P698 "22103191" @default.