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- Q82719766 description "artículu científicu espublizáu en xunetu de 1972" @default.
- Q82719766 description "scientific article published on 01 July 1972" @default.
- Q82719766 description "wetenschappelijk artikel" @default.
- Q82719766 description "наукова стаття, опублікована в липні 1972" @default.
- Q82719766 name "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 name "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 type Item @default.
- Q82719766 label "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 label "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 prefLabel "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 prefLabel "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 P1433 Q82719766-7F940352-7B39-4EAB-9724-8CB659557828 @default.
- Q82719766 P1476 Q82719766-7ABBA172-E7A8-4F82-8A0B-D842566C3C57 @default.
- Q82719766 P2093 Q82719766-506E630C-948D-4211-9F6B-4661223BA7DC @default.
- Q82719766 P2093 Q82719766-904769B0-D381-418F-B820-F6B3565BD3D2 @default.
- Q82719766 P2093 Q82719766-C260B14D-76B6-4980-8F38-6FBCCF3000BD @default.
- Q82719766 P2093 Q82719766-DDA7CA77-BD3C-49FA-B62C-409AAA72D948 @default.
- Q82719766 P304 Q82719766-EBF4BE70-2FB7-4DD4-8837-5BFE2CE4189F @default.
- Q82719766 P31 Q82719766-FC8E47FA-4245-4DAF-ABB0-3B27B7925DD7 @default.
- Q82719766 P356 Q82719766-3FF63E90-A450-4DFC-805D-047681E94C9C @default.
- Q82719766 P407 Q82719766-554B33B7-4F9B-4A26-9E5D-42E82FCA252F @default.
- Q82719766 P433 Q82719766-CB9077E4-8DEA-44FC-9978-5199C34A6A65 @default.
- Q82719766 P478 Q82719766-3015BA96-3A17-4553-AB3D-27E414237C1A @default.
- Q82719766 P577 Q82719766-1AFF3A9B-4441-4638-BEE3-095D51817B6C @default.
- Q82719766 P698 Q82719766-5C49A8E7-F455-4745-A066-4167464B8EFB @default.
- Q82719766 P819 Q82719766-1C2BAB92-0E42-4EF2-95DF-5AD8DE4EEB91 @default.
- Q82719766 P356 AO.11.001590 @default.
- Q82719766 P698 20119191 @default.
- Q82719766 P1433 Q4781557 @default.
- Q82719766 P1476 "Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of Hydrogen" @default.
- Q82719766 P2093 "E T Hutcheson" @default.
- Q82719766 P2093 "G Hass" @default.
- Q82719766 P2093 "J T Cox" @default.
- Q82719766 P2093 "W R Hunter" @default.
- Q82719766 P304 "1590-1593" @default.
- Q82719766 P31 Q13442814 @default.
- Q82719766 P356 "10.1364/AO.11.001590" @default.
- Q82719766 P407 Q1860 @default.
- Q82719766 P433 "7" @default.
- Q82719766 P478 "11" @default.
- Q82719766 P577 "1972-07-01T00:00:00Z" @default.
- Q82719766 P698 "20119191" @default.
- Q82719766 P819 "1972ApOpt..11.1590H" @default.