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- Q84960198 description "artículu científicu espublizáu en xunetu de 2012" @default.
- Q84960198 description "scientific article published on 01 July 2012" @default.
- Q84960198 description "wetenschappelijk artikel" @default.
- Q84960198 description "наукова стаття, опублікована в липні 2012" @default.
- Q84960198 name "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 name "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 type Item @default.
- Q84960198 label "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 label "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 prefLabel "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 prefLabel "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 P1433 Q84960198-86EA34CD-5EDC-4359-BCB5-D317B3E99315 @default.
- Q84960198 P1476 Q84960198-42730DAD-7D36-4BC9-857F-7B7679EBAB9E @default.
- Q84960198 P2093 Q84960198-32BF39A8-9CAA-47A8-BD89-37BFC0CE5B79 @default.
- Q84960198 P2093 Q84960198-62804024-802A-44B2-8C71-2F2829280A3C @default.
- Q84960198 P2093 Q84960198-6B34DDA8-155E-4ACB-898D-AE77B22B6342 @default.
- Q84960198 P2093 Q84960198-7460FB5B-155A-442D-B9D9-C9AD59B73B30 @default.
- Q84960198 P2093 Q84960198-80A6C2DC-0BFA-4D02-ADBC-62B0D1B9AF60 @default.
- Q84960198 P2093 Q84960198-8B16A4A3-80D2-4854-B4E9-9713D9A3B3D6 @default.
- Q84960198 P2093 Q84960198-9B4E0D7A-FF8F-4401-A026-8D054150923B @default.
- Q84960198 P2093 Q84960198-B018C50C-5D95-498E-85C6-70F31F965C70 @default.
- Q84960198 P2093 Q84960198-C2BDFC07-2BD3-4C49-AA1C-ABD27663B1CD @default.
- Q84960198 P2093 Q84960198-E58CF0CA-50CC-40EE-9B54-1496828D8FF1 @default.
- Q84960198 P304 Q84960198-167F4E51-31B8-4252-9336-EE74199E32BC @default.
- Q84960198 P31 Q84960198-F700D22B-8F0C-443F-936D-8B87501623F0 @default.
- Q84960198 P356 Q84960198-347A077E-5E44-4AEA-BB29-4A32A25E9154 @default.
- Q84960198 P407 Q84960198-83BBF48B-EFFE-4556-9EAD-79E35541811C @default.
- Q84960198 P433 Q84960198-7E5DB46D-C81D-458B-9222-5A5EB2FC2874 @default.
- Q84960198 P478 Q84960198-17F3B24E-E266-44EE-BFE1-8BA471356B1D @default.
- Q84960198 P577 Q84960198-0CA02B78-38B8-4952-91F0-ADCC285BD82F @default.
- Q84960198 P698 Q84960198-33EC2F81-614B-4D0D-9793-B30C888CC0FA @default.
- Q84960198 P356 JNN.2012.6324 @default.
- Q84960198 P698 22966658 @default.
- Q84960198 P1433 Q2364336 @default.
- Q84960198 P1476 "Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry" @default.
- Q84960198 P2093 "Jae Jin Yoon" @default.
- Q84960198 P2093 "Jinho Joo" @default.
- Q84960198 P2093 "Jun Hyuk Choi" @default.
- Q84960198 P2093 "Jun Young Kim" @default.
- Q84960198 P2093 "Nilesh Barange" @default.
- Q84960198 P2093 "Soo Min Hwang" @default.
- Q84960198 P2093 "Soon Yong Hwang" @default.
- Q84960198 P2093 "Tae Ho Ghong" @default.
- Q84960198 P2093 "Tae Jung Kim" @default.
- Q84960198 P2093 "Young Dong Kim" @default.
- Q84960198 P304 "5804-5807" @default.
- Q84960198 P31 Q13442814 @default.
- Q84960198 P356 "10.1166/JNN.2012.6324" @default.
- Q84960198 P407 Q1860 @default.
- Q84960198 P433 "7" @default.
- Q84960198 P478 "12" @default.
- Q84960198 P577 "2012-07-01T00:00:00Z" @default.
- Q84960198 P698 "22966658" @default.