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- Q85058171 description "artículu científicu espublizáu n'ochobre de 1993" @default.
- Q85058171 description "scientific article published on 01 October 1993" @default.
- Q85058171 description "wetenschappelijk artikel" @default.
- Q85058171 description "наукова стаття, опублікована в жовтні 1993" @default.
- Q85058171 name "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 name "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 type Item @default.
- Q85058171 label "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 label "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 prefLabel "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 prefLabel "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 P1433 Q85058171-E5DE6B84-1F62-486C-8046-3C742EC21716 @default.
- Q85058171 P1476 Q85058171-186576F6-C911-4AAA-9D30-824036626836 @default.
- Q85058171 P2093 Q85058171-539C7A2A-E42D-42F9-A03C-37ED4E202587 @default.
- Q85058171 P2093 Q85058171-D52DB62D-1459-4F0B-8E12-5823DAFF72BB @default.
- Q85058171 P2093 Q85058171-E6D0F323-0F9B-4D00-B7FA-82E950581FAC @default.
- Q85058171 P304 Q85058171-81018D4F-89C8-4619-AF26-7036EA8C3876 @default.
- Q85058171 P31 Q85058171-2C202EDE-CB2D-42C0-9AF8-DBF447EF79F2 @default.
- Q85058171 P356 Q85058171-39F80C7E-900A-4E12-9E89-94D1EEA52E80 @default.
- Q85058171 P407 Q85058171-61DDE2A6-811C-4ADE-A6CE-A0AC5A0D10EC @default.
- Q85058171 P433 Q85058171-05684075-3190-4384-B456-CA35BB838893 @default.
- Q85058171 P478 Q85058171-DA8D9CA7-94F5-43A1-AB6A-DB0635AF4B74 @default.
- Q85058171 P577 Q85058171-94CD39FE-B649-4F5C-93CE-8CBED61453B3 @default.
- Q85058171 P698 Q85058171-CBBE28C6-E1E8-49BC-A515-62AA65134DE0 @default.
- Q85058171 P819 Q85058171-88F985DE-744C-4C78-ADE4-C665758F0E20 @default.
- Q85058171 P921 Q85058171-DFE4FDD3-2697-4DEC-9001-C01D7D44A9C4 @default.
- Q85058171 P356 AO.32.005594 @default.
- Q85058171 P698 20856374 @default.
- Q85058171 P1433 Q4781557 @default.
- Q85058171 P1476 "Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion plating" @default.
- Q85058171 P2093 "K Balasubramanian" @default.
- Q85058171 P2093 "K H Guenther" @default.
- Q85058171 P2093 "X F Han" @default.
- Q85058171 P304 "5594-5600" @default.
- Q85058171 P31 Q13442814 @default.
- Q85058171 P356 "10.1364/AO.32.005594" @default.
- Q85058171 P407 Q1860 @default.
- Q85058171 P433 "28" @default.
- Q85058171 P478 "32" @default.
- Q85058171 P577 "1993-10-01T00:00:00Z" @default.
- Q85058171 P698 "20856374" @default.
- Q85058171 P819 "1993ApOpt..32.5594B" @default.
- Q85058171 P921 Q1137203 @default.