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- Q85218896 description "artículu científicu espublizáu n'agostu de 2014" @default.
- Q85218896 description "scientific article published on 01 August 2014" @default.
- Q85218896 description "wetenschappelijk artikel" @default.
- Q85218896 description "наукова стаття, опублікована в серпні 2014" @default.
- Q85218896 name "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 name "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 type Item @default.
- Q85218896 label "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 label "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 prefLabel "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 prefLabel "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
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- Q85218896 P433 Q85218896-5218B0A6-BE7A-493A-BB27-C0E7DED83615 @default.
- Q85218896 P478 Q85218896-30FCAAC8-D137-4339-9BC7-A12C545D87F1 @default.
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- Q85218896 P698 Q85218896-0192E763-75B8-41EB-BEE2-30B2F11C3D9E @default.
- Q85218896 P356 1.4892997 @default.
- Q85218896 P698 25173258 @default.
- Q85218896 P1433 Q2364002 @default.
- Q85218896 P1476 "Stress-induced light scattering method for the detection of latent flaws on fine polished glass substrates" @default.
- Q85218896 P2093 "K Nonaka" @default.
- Q85218896 P2093 "K Sakai" @default.
- Q85218896 P304 "083303" @default.
- Q85218896 P31 Q13442814 @default.
- Q85218896 P356 "10.1063/1.4892997" @default.
- Q85218896 P433 "8" @default.
- Q85218896 P478 "85" @default.
- Q85218896 P50 Q85218893 @default.
- Q85218896 P577 "2014-08-01T00:00:00Z" @default.
- Q85218896 P698 "25173258" @default.