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- Q87715793 description "artículu científicu espublizáu n'abril de 2017" @default.
- Q87715793 description "scientific article published on 01 April 2017" @default.
- Q87715793 description "wetenschappelijk artikel" @default.
- Q87715793 description "наукова стаття, опублікована у квітні 2017" @default.
- Q87715793 name "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 name "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 type Item @default.
- Q87715793 label "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 label "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 prefLabel "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 prefLabel "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
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- Q87715793 P2093 Q87715793-B8E51219-F575-43D7-95B6-0D78EE798A93 @default.
- Q87715793 P304 Q87715793-B173A88A-7DC5-41FF-97D7-7DFA5E76595B @default.
- Q87715793 P31 Q87715793-1CD5C9CD-D993-4B77-B2F5-09F7CEBB9D82 @default.
- Q87715793 P356 Q87715793-6900F0BA-373A-4C35-8B9A-A486287C3032 @default.
- Q87715793 P433 Q87715793-68C8347F-23AE-4ACB-B8AA-32D0A1CFD792 @default.
- Q87715793 P478 Q87715793-46F9ECFB-3FAF-4A32-9B1F-B9D6346FD0E5 @default.
- Q87715793 P50 Q87715793-12C97656-BEC0-4363-B597-853DC899FF8B @default.
- Q87715793 P577 Q87715793-02A6CE49-AE94-4A98-8E99-169472F23905 @default.
- Q87715793 P698 Q87715793-02D03BDB-3409-41A6-94BF-461DA1BA9BDC @default.
- Q87715793 P356 OL.42.001325 @default.
- Q87715793 P698 28362760 @default.
- Q87715793 P1433 Q7098918 @default.
- Q87715793 P1476 "Direct mapping and characterization of dry etch damage-induced PN junction for long-wavelength HgCdTe infrared detector arrays" @default.
- Q87715793 P2093 "Wei Lu" @default.
- Q87715793 P2093 "Xiaoshuang Chen" @default.
- Q87715793 P2093 "Yantao Li" @default.
- Q87715793 P2093 "Yiyu Chen" @default.
- Q87715793 P2093 "Zhenhua Ye" @default.
- Q87715793 P304 "1325-1328" @default.
- Q87715793 P31 Q13442814 @default.
- Q87715793 P356 "10.1364/OL.42.001325" @default.
- Q87715793 P433 "7" @default.
- Q87715793 P478 "42" @default.
- Q87715793 P50 Q47109354 @default.
- Q87715793 P577 "2017-04-01T00:00:00Z" @default.
- Q87715793 P698 "28362760" @default.