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- Q90261843 description "artículu científicu espublizáu en xunetu de 2018" @default.
- Q90261843 description "im Juli 2018 veröffentlichter wissenschaftlicher Artikel" @default.
- Q90261843 description "scientific article published on 05 July 2018" @default.
- Q90261843 description "wetenschappelijk artikel" @default.
- Q90261843 description "наукова стаття, опублікована в липні 2018" @default.
- Q90261843 name "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 name "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 type Item @default.
- Q90261843 label "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 label "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 prefLabel "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 prefLabel "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 P1433 Q90261843-1414477C-B5A9-42B5-AD8C-E5C9F4CA375F @default.
- Q90261843 P1476 Q90261843-783DA2F0-76F5-4A44-8933-E34747D42008 @default.
- Q90261843 P2093 Q90261843-1D5C8C27-21C3-4B24-9678-BA6DE153BA2F @default.
- Q90261843 P2093 Q90261843-22742927-1C6C-4C19-9280-D02E9D501DF9 @default.
- Q90261843 P2093 Q90261843-237E32A2-183C-40D9-B6AE-15C9FFB74BE1 @default.
- Q90261843 P2093 Q90261843-32891156-FC9A-40B6-B029-B9719D232776 @default.
- Q90261843 P2093 Q90261843-8941BF40-547D-4348-BB6A-1365308753A1 @default.
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- Q90261843 P2093 Q90261843-F4D5CDDF-2630-4157-9313-16AE43BC7FE9 @default.
- Q90261843 P2860 Q90261843-0E590FDE-2FB1-48D1-8614-0DFD4A7C5EA7 @default.
- Q90261843 P2860 Q90261843-2255DD52-DE32-4DCC-B005-A852DB085EBE @default.
- Q90261843 P304 Q90261843-853424C3-9D1E-472A-84D4-6667F7C0A3A5 @default.
- Q90261843 P31 Q90261843-C8EE4AAE-F9CE-40C2-97A8-FFC3D403A525 @default.
- Q90261843 P356 Q90261843-0F039FA6-7975-4BC6-A58E-DAA9D2E7A527 @default.
- Q90261843 P478 Q90261843-49196622-FE75-4751-8E19-3DB46FAC4251 @default.
- Q90261843 P50 Q90261843-2AF418B9-C9D1-4A3E-8DDF-1C376A98EBFE @default.
- Q90261843 P50 Q90261843-8EAAE1F7-F4C5-40EC-881C-8FECD28F4D89 @default.
- Q90261843 P577 Q90261843-8A5637BA-827B-4FC5-A31D-0B7868BB6E61 @default.
- Q90261843 P698 Q90261843-5D59ACDB-41E6-46C6-8702-894A4F6B5228 @default.
- Q90261843 P932 Q90261843-99A47FC0-1463-44DB-B9D4-1182F5A4E6A4 @default.
- Q90261843 P356 BJNANO.9.184 @default.
- Q90261843 P698 30013886 @default.
- Q90261843 P1433 Q814756 @default.
- Q90261843 P1476 "A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1-x Ge x and Si layers" @default.
- Q90261843 P2093 "Emmanuel Scheid" @default.
- Q90261843 P2093 "Filadelfo Cristiano" @default.
- Q90261843 P2093 "Hiba Rizk" @default.
- Q90261843 P2093 "Richard Daubriac" @default.
- Q90261843 P2093 "Richard Monflier" @default.
- Q90261843 P2093 "Rémi Beneyton" @default.
- Q90261843 P2093 "Sylvain Joblot" @default.
- Q90261843 P2860 Q50914352 @default.
- Q90261843 P2860 Q83304899 @default.
- Q90261843 P304 "1926-1939" @default.
- Q90261843 P31 Q13442814 @default.
- Q90261843 P356 "10.3762/BJNANO.9.184" @default.
- Q90261843 P478 "9" @default.
- Q90261843 P50 Q88028920 @default.
- Q90261843 P50 Q88028922 @default.
- Q90261843 P577 "2018-07-05T00:00:00Z" @default.
- Q90261843 P698 "30013886" @default.
- Q90261843 P932 "6036972" @default.