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- Q90334545 description "artículu científicu espublizáu en setiembre de 2019" @default.
- Q90334545 description "scientific article published on 26 September 2019" @default.
- Q90334545 description "wetenschappelijk artikel" @default.
- Q90334545 description "наукова стаття, опублікована 26 вересня 2019" @default.
- Q90334545 name "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 name "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 type Item @default.
- Q90334545 label "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 label "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 prefLabel "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 prefLabel "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
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- Q90334545 P356 MA12193149 @default.
- Q90334545 P698 31561545 @default.
- Q90334545 P1433 Q6786584 @default.
- Q90334545 P1476 "Effect of Oxygen Content on Current Stress-Induced Instability in Bottom-Gate Amorphous InGaZnO Thin-Film Transistors" @default.
- Q90334545 P2093 "Daehyun Ko" @default.
- Q90334545 P2093 "Dong Myong Kim" @default.
- Q90334545 P2093 "Hara Kang" @default.
- Q90334545 P2093 "Jae-Young Kim" @default.
- Q90334545 P2093 "Jihyun Rhee" @default.
- Q90334545 P2093 "Sung-Jin Choi" @default.
- Q90334545 P275 Q20007257 @default.
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- Q90334545 P31 Q13442814 @default.
- Q90334545 P356 "10.3390/MA12193149" @default.
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- Q90334545 P577 "2019-09-26T00:00:00Z" @default.
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