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- Q91670870 description "artículu científicu espublizáu n'abril de 2019" @default.
- Q91670870 description "scientific article published on 01 April 2019" @default.
- Q91670870 description "wetenschappelijk artikel" @default.
- Q91670870 description "наукова стаття, опублікована 1 квітня 2019" @default.
- Q91670870 name "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 name "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 type Item @default.
- Q91670870 label "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 label "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 prefLabel "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 prefLabel "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 P1433 Q91670870-55E36487-5750-44F4-BADC-776565125041 @default.
- Q91670870 P1476 Q91670870-8E2E3AE4-F948-4CDC-99D5-97276013284E @default.
- Q91670870 P2093 Q91670870-258BE90E-EECE-4137-AD43-A80FC1B977FD @default.
- Q91670870 P2093 Q91670870-55D00C44-143B-4A8E-BD9D-7F638A9824F7 @default.
- Q91670870 P2093 Q91670870-841BB0E5-C45F-491D-B08D-5B2EAAD62091 @default.
- Q91670870 P2093 Q91670870-C815BD59-C1E8-4703-AF03-96BA91A5E35F @default.
- Q91670870 P304 Q91670870-FB2828FA-F3EB-49D2-872E-A152D3EEDAC6 @default.
- Q91670870 P31 Q91670870-E4B31A56-47BB-4C34-867D-88A85E54B85F @default.
- Q91670870 P356 Q91670870-15ADC7E0-5F98-49A0-89D4-317989BDD0E7 @default.
- Q91670870 P433 Q91670870-D294A8FA-294D-4238-9F52-C769D31EBD7A @default.
- Q91670870 P478 Q91670870-3ECC2540-1AF7-430E-90F3-4EA6ED59982C @default.
- Q91670870 P577 Q91670870-24668CE2-D421-436E-8D7F-137B41FA7B59 @default.
- Q91670870 P698 Q91670870-95E1E6BF-174C-4173-8A70-A3683F4A0F03 @default.
- Q91670870 P921 Q91670870-82DEB474-0745-4ED7-BD98-6FEC277E0B4D @default.
- Q91670870 P356 1.5058218 @default.
- Q91670870 P698 31042991 @default.
- Q91670870 P1433 Q2364002 @default.
- Q91670870 P1476 "Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell" @default.
- Q91670870 P2093 "Leping Zhou" @default.
- Q91670870 P2093 "Tengxiao Ma" @default.
- Q91670870 P2093 "Xiaoze Du" @default.
- Q91670870 P2093 "Yongping Yang" @default.
- Q91670870 P304 "045118" @default.
- Q91670870 P31 Q13442814 @default.
- Q91670870 P356 "10.1063/1.5058218" @default.
- Q91670870 P433 "4" @default.
- Q91670870 P478 "90" @default.
- Q91670870 P577 "2019-04-01T00:00:00Z" @default.
- Q91670870 P698 "31042991" @default.
- Q91670870 P921 Q1137203 @default.