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- Q91805360 description "artículu científicu espublizáu n'avientu de 2019" @default.
- Q91805360 description "scientific article published on 09 December 2019" @default.
- Q91805360 description "wetenschappelijk artikel" @default.
- Q91805360 description "наукова стаття, опублікована 9 грудня 2019" @default.
- Q91805360 name "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 name "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 type Item @default.
- Q91805360 label "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 label "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 prefLabel "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 prefLabel "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 P1433 Q91805360-BF344610-53E1-4571-8F1E-EDB8E06C127C @default.
- Q91805360 P1476 Q91805360-762A4EE1-8348-4A0E-B1D7-58D165C8A625 @default.
- Q91805360 P2093 Q91805360-145F74DA-6A6E-405A-AD84-CAE324B0389B @default.
- Q91805360 P2093 Q91805360-1474784D-09D6-44C7-9E3C-595FB43415F1 @default.
- Q91805360 P2093 Q91805360-2B0E1D32-3E5B-444F-9E44-E066CB7D8ADC @default.
- Q91805360 P2093 Q91805360-5D5F34C3-DD50-4E72-9A76-1A36039B80A1 @default.
- Q91805360 P2093 Q91805360-65B2FCB2-838F-4F8F-AE4B-3FB57D3BCD79 @default.
- Q91805360 P2093 Q91805360-7C289ABD-9C1F-4DB3-9689-CB83B8D84CBF @default.
- Q91805360 P2093 Q91805360-840353CA-12AB-403C-BDE5-B7873399070A @default.
- Q91805360 P2093 Q91805360-8FFC9602-5358-4404-92C1-02583281FCAC @default.
- Q91805360 P2093 Q91805360-AD4BE143-2570-4EC8-9560-91D1D0C72D4B @default.
- Q91805360 P304 Q91805360-7DE4D3B9-4C9B-461A-B063-406521A017AE @default.
- Q91805360 P31 Q91805360-3D9A41A5-CBC7-48FF-9898-7F790C2DF04A @default.
- Q91805360 P356 Q91805360-2225FDEC-6156-49F2-8542-00E48076A20F @default.
- Q91805360 P433 Q91805360-955CDFF4-B822-4814-8B74-5BEBC8C4D585 @default.
- Q91805360 P478 Q91805360-6A279D94-CAFD-4CF5-BE0C-C8FB58FAE070 @default.
- Q91805360 P50 Q91805360-56691E2F-EF21-4B2F-88D3-452458619300 @default.
- Q91805360 P577 Q91805360-0E2986AD-BE09-4136-B666-BC7A28190D15 @default.
- Q91805360 P698 Q91805360-DF6BEC71-4EAD-4550-9888-CAE47B81F055 @default.
- Q91805360 P818 Q91805360-623010be-2701-455f-840e-94350ae67eab @default.
- Q91805360 P356 AB5FF6 @default.
- Q91805360 P698 31816608 @default.
- Q91805360 P1433 Q972896 @default.
- Q91805360 P1476 "Understanding the role of threading dislocations on 4H-SiC MOSFET breakdown under high temperature reverse bias stress" @default.
- Q91805360 P2093 "A Russo" @default.
- Q91805360 P2093 "B Carbone" @default.
- Q91805360 P2093 "C Di Martino" @default.
- Q91805360 P2093 "C Venuto" @default.
- Q91805360 P2093 "E Zanetti" @default.
- Q91805360 P2093 "F Roccaforte" @default.
- Q91805360 P2093 "M S Alessandrino" @default.
- Q91805360 P2093 "M Saggio" @default.
- Q91805360 P2093 "P Fiorenza" @default.
- Q91805360 P304 "125203" @default.
- Q91805360 P31 Q13442814 @default.
- Q91805360 P356 "10.1088/1361-6528/AB5FF6" @default.
- Q91805360 P433 "12" @default.
- Q91805360 P478 "31" @default.
- Q91805360 P50 Q42319238 @default.
- Q91805360 P577 "2019-12-09T00:00:00Z" @default.
- Q91805360 P698 "31816608" @default.
- Q91805360 P818 "2009.04835" @default.