Matches in Wikidata for { <http://www.wikidata.org/entity/Q95819000> ?p ?o ?g. }
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- Q95819000 description "article scientifique publié en 2008" @default.
- Q95819000 description "wetenschappelijk artikel" @default.
- Q95819000 description "наукова стаття" @default.
- Q95819000 name "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 name "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 type Item @default.
- Q95819000 label "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 label "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 prefLabel "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 prefLabel "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 P1433 Q95819000-06A7D3B8-4A73-4B06-B4C7-919439AF0110 @default.
- Q95819000 P1476 Q95819000-60F77011-8A14-4CDF-94C5-8EB59E49C732 @default.
- Q95819000 P2093 Q95819000-AE138240-3C77-4046-88AA-FC53DF735B98 @default.
- Q95819000 P2093 Q95819000-BCC5DC03-9B4A-4118-9326-C9290BB415DA @default.
- Q95819000 P2093 Q95819000-C26C21D1-2EF7-4640-8754-244BA4909561 @default.
- Q95819000 P304 Q95819000-F5F13886-B7DC-4983-9286-88DC7F9F86CE @default.
- Q95819000 P31 Q95819000-097AB712-846B-4F1E-9FF9-BAAF9C9681FC @default.
- Q95819000 P356 Q95819000-7BF71E18-E967-4084-AA53-5C3210413574 @default.
- Q95819000 P433 Q95819000-B6CC7CCD-DA62-4495-831B-DB91BC9780D8 @default.
- Q95819000 P478 Q95819000-DB237F2A-92A3-4463-9944-69AF01EF1585 @default.
- Q95819000 P577 Q95819000-4E496E45-5179-4490-8A81-F89251B6BCA0 @default.
- Q95819000 P698 Q95819000-14809DEC-681E-4A88-B025-E0266AA79872 @default.
- Q95819000 P921 Q95819000-71ACBCDA-085A-4398-9858-F7F36A6E8C41 @default.
- Q95819000 P356 JNN.2008.035 @default.
- Q95819000 P698 18468184 @default.
- Q95819000 P1433 Q2364336 @default.
- Q95819000 P1476 "Cross-sectional STEM observation of nanoparticle-attached silicon wafer: specimen prepared by focused ion-beam" @default.
- Q95819000 P2093 "Hiroshi Nishihara" @default.
- Q95819000 P2093 "Tetsu Yonezawa" @default.
- Q95819000 P2093 "Yoshinori Yamanoi" @default.
- Q95819000 P304 "1518-1522" @default.
- Q95819000 P31 Q13442814 @default.
- Q95819000 P356 "10.1166/JNN.2008.035" @default.
- Q95819000 P433 "3" @default.
- Q95819000 P478 "8" @default.
- Q95819000 P577 "2008-03-01T00:00:00Z" @default.
- Q95819000 P698 "18468184" @default.
- Q95819000 P921 Q61231 @default.