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- W103638709 abstract "Functional testing of VLSI devices may require a prohibitive amount of engineering time and/or produce poor fault coverage. Fully structured testing can grow the die enough to impact yield. A Judicious mixture of the two makes the MC68020 a highly testable chip without significantly affecting die size." @default.
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- W103638709 title "Testability features of the MC68020" @default.
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