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- W103699639 abstract "Probe microscopy (scanning tunneling microscopy and atomic force microscopy) and digital image correlation together serve as a potentially powerful tool for experimentallyinvestigating the mechanical behaviors of materials at the sub-micron and nanometer scales. Based on the tunneling effect in quantum physics, the scanning tunnelingmicroscope (STM) records surface topography quantitatively and can achieve angstrom resolution. The digital image correlation (DIC) extracts the displacements and gradientsfrom the undeformed and deformed topographical images.In this work, a calibration has been performed on the existing STM built in-house and the coefficients used in the STM system were confirmed. Major improvements on severalcomponents of the system have been made, including constructing a new actuator probe to decouple its in-plane and out-of-plane movements, designing and implementing a newfirst-stage amplifier to reduce the noise output by a factor of 10 and modeling of the controller in the STM feedback loop.Further, systematic study of the digital image correlation has been conducted. In the simple case of one-dimensional correlation, key parameters involved are the subset size,variables in the displacement representation, frequency content of the signal and noise. The one-dimensional study was then extended to two dimensions. In addition to thosekey parameters identified in the one-dimensional study, the sampling rate poses substantial influence on the correlation accuracy. Low amplitude, high frequency noisestill increases the correlation error significantly." @default.
- W103699639 created "2016-06-24" @default.
- W103699639 creator A5088262708 @default.
- W103699639 date "2001-07-01" @default.
- W103699639 modified "2023-09-23" @default.
- W103699639 title "Scanning tunneling microscopy and digital image correlation in nanomechanics investigations" @default.
- W103699639 hasPublicationYear "2001" @default.
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