FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W10428607> ?p ?o ?g. }

• W10428607 abstract "This thesis analyses the design strategies used to protect RF circuits that are implemented in CMOS technologies. It investigates, in detail, the physical mechanisms involved when a ggNMOS structure is exposed to an ESD event and undergoes snapback. The understanding gained is used to understand why the performance of the current RF ESD clamp is poor and suggestions are made as to how the performance of ggNMOS clamps can be improved beyond the current body of knowledge. The ultimate aim is to be able to design effective ESD protection clamps whilst minimising the effect the circuit has on RF I/O signals. A current ggNMOS based RF ESD I/O protection circuit is analysed in detail using a Transmission Line Pulse (TLP) tester. This is shown to be a very effective diagnostic tool by showing many characteristics of the ggNMOS during the triggering and conducting phase of the ESD event and demonstrate deficiencies in the clamp design. The use of a FIB enhances the analysis by allowing the isolation of individual components in the circuit and therefore their analysis using the TLP tester. SPICE simulations are used to provide further commentary on the debate surrounding the specification required of a TLP tester for there to be a good correlation between a TLP test and the industry standard Human Body Model (HBM) ESD test. Finite element simulations are used to probe deeper in to the mechanisms involved when a ggNMOS undergoes snapback especially with regard to the contribution parasitic components within the ggNMOS make to the snapback process. New ggNMOS clamps are proposed which after some modification are shown to work. Some of the finite element experiments are repeated in a 0.18μπ7. process CMOS test chip and a comparison is made between the two sets of results. In the concluding chapter understanding that has been gained from previous chapters is combined with the published body of knowledge to suggest and explain improvements in the design of a ggNMOS for RF and standard applications. These improvements will improve homogeneity of ggNMOS operation thus allowing the device size to be reduced and parasitic loading for a given ESD performance. These techniques can also be used to ensure that the ESD current does not take an unintended path through the chip." @default.
• W10428607 created "2016-06-24" @default.
• W10428607 creator A5002518868 @default.
• W10428607 date "2007-01-01" @default.
• W10428607 modified "2023-09-24" @default.
• W10428607 title "Analysis of design strategies for RF ESD problems in CMOS circuits" @default.
• W10428607 hasPublicationYear "2007" @default.
• W10428607 type Work @default.
• W10428607 sameAs 10428607 @default.
• W10428607 citedByCount "1" @default.
• W10428607 countsByYear W104286072021 @default.
• W10428607 crossrefType "dissertation" @default.
• W10428607 hasAuthorship W10428607A5002518868 @default.
• W10428607 hasConcept C119599485 @default.
• W10428607 hasConcept C127413603 @default.
• W10428607 hasConcept C134146338 @default.
• W10428607 hasConcept C165801399 @default.
• W10428607 hasConcept C190560348 @default.
• W10428607 hasConcept C205483674 @default.
• W10428607 hasConcept C24326235 @default.
• W10428607 hasConcept C2779888857 @default.
• W10428607 hasConcept C2780077345 @default.
• W10428607 hasConcept C2781089380 @default.
• W10428607 hasConcept C33441834 @default.
• W10428607 hasConcept C46362747 @default.
• W10428607 hasConcept C530198007 @default.
• W10428607 hasConceptScore W10428607C119599485 @default.
• W10428607 hasConceptScore W10428607C127413603 @default.
• W10428607 hasConceptScore W10428607C134146338 @default.
• W10428607 hasConceptScore W10428607C165801399 @default.
• W10428607 hasConceptScore W10428607C190560348 @default.
• W10428607 hasConceptScore W10428607C205483674 @default.
• W10428607 hasConceptScore W10428607C24326235 @default.
• W10428607 hasConceptScore W10428607C2779888857 @default.
• W10428607 hasConceptScore W10428607C2780077345 @default.
• W10428607 hasConceptScore W10428607C2781089380 @default.
• W10428607 hasConceptScore W10428607C33441834 @default.
• W10428607 hasConceptScore W10428607C46362747 @default.
• W10428607 hasConceptScore W10428607C530198007 @default.
• W10428607 hasLocation W104286071 @default.
• W10428607 hasOpenAccess W10428607 @default.
• W10428607 hasPrimaryLocation W104286071 @default.
• W10428607 hasRelatedWork W1631812148 @default.
• W10428607 hasRelatedWork W2015927385 @default.
• W10428607 hasRelatedWork W2049719814 @default.
• W10428607 hasRelatedWork W2086880258 @default.
• W10428607 hasRelatedWork W2161612375 @default.
• W10428607 hasRelatedWork W2193731686 @default.
• W10428607 hasRelatedWork W2196309363 @default.
• W10428607 hasRelatedWork W2351426681 @default.
• W10428607 hasRelatedWork W2363353746 @default.
• W10428607 hasRelatedWork W2373235428 @default.
• W10428607 hasRelatedWork W2379948008 @default.
• W10428607 hasRelatedWork W2384857948 @default.
• W10428607 hasRelatedWork W2387496203 @default.
• W10428607 hasRelatedWork W2393380518 @default.
• W10428607 hasRelatedWork W2532159511 @default.
• W10428607 hasRelatedWork W2891099723 @default.
• W10428607 hasRelatedWork W2983787234 @default.
• W10428607 hasRelatedWork W3004951664 @default.
• W10428607 hasRelatedWork W3126282966 @default.
• W10428607 hasRelatedWork W3127430377 @default.
• W10428607 isParatext "false" @default.
• W10428607 isRetracted "false" @default.
• W10428607 magId "10428607" @default.
• W10428607 workType "dissertation" @default.