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- W119767555 abstract "Electronic systems installed in their operation environments often require regular testing. The nanometer transistor size in new IC design technologies makes the electronic systems more vulnerable ..." @default.
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- W119767555 date "2011-01-01" @default.
- W119767555 modified "2023-09-27" @default.
- W119767555 title "Design of an in-field Embedded Test Controller" @default.
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