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- W128528657 abstract "ABSTRACT: A practical computing procedure has been developed for calculating reflection high energy electron diffraction (RHEED) from molecular beam epitaxy (MBE) growing surfaces. A birth-death growth model has been generalized to describe the epitaxy growth as well as interface formation, and the diffraction from MBE growing surfaces is treated dynamically using a systematic reflection approximation. Our method is shown to be able to reproduce almost all features of measured RHEED intensity oscillations from low-index surfaces." @default.
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- W128528657 date "1991-01-01" @default.
- W128528657 modified "2023-10-16" @default.
- W128528657 title "DYNAMICAL DIFFRACTION CALCULATIONS FOR RHEED INTENSITY OSCILLATIONS DURING MBE GROWTH" @default.
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- W128528657 doi "https://doi.org/10.1016/b978-0-444-88864-8.50150-3" @default.
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