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- W135014868 abstract "In this paper an alternative solution for thermal transient testing is presented, where the test chip contains the usual thermal transient tester equipment as well. The sophisticated, PC based evaluation assures the localization of physical defects in the heat removing path. A method for compact model generation is also provided. The paper presents the details of the disign and the evaluating solftware. Experimental results demonstrate the advantages of the new method." @default.
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- W135014868 date "1998-07-15" @default.
- W135014868 modified "2023-09-28" @default.
- W135014868 title "Thermal transient testing without a tester" @default.
- W135014868 hasPublicationYear "1998" @default.
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