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- W13593586 abstract "The 1/f noise spectrum of solid state devices is expressed in terms of device parameters such as current, carrier lifetime and Hooge parameter. The Hooge parameter is calculated for collision 1/f noise and Umklapp 1/f noise. The first gives Hooge parameters that are one to several orders of magnitude too small. The expression for Umklapp 1/f noise contains an exponential involving the Debye temperature of the material; this yields often agreement, even for the well-defined temperature dependence. Experiments on Si-JFETs and p-channel silicon MOSFETs imply the validity of the Umklapp theory and preliminary data verify the temperature dependence. The collector current of transistors shows no Umklapp 1/f noise whereas the base current seems to show it. Long Hg 1-x Cd x Te n + -p diodes seem to show more than Umklapp 1/f noise. At present there is no evidence for injection-extraction and generation-recombination noise, even in the collector current of transistors." @default.
- W13593586 created "2016-06-24" @default.
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- W13593586 date "1986-01-01" @default.
- W13593586 modified "2023-09-23" @default.
- W13593586 title "THEORY OF AND EXPERIMENTS ON QUANTUM 1/f NOISE" @default.
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- W13593586 doi "https://doi.org/10.1016/b978-0-444-86992-0.50007-2" @default.
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