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- W1485022046 abstract "Matrix formalism is a very systematic method to find the reflectance or transmittance in a stratified medium consisting of a pile of thin homogeneous films. Fitting experimental values of reflectance curve to expressions obtained from the matrix formalism method is an efficient method to estimate the refractive index (n) of a dielectric and/or the real and imaginary parts of a metal permittivity (e). In the next section, the method of matrix formalism is briefly reviewed with some examples to show how it can be applied in curve fitting to determine refractive indices or the metal permittivity. Applications to more complex structures such as planar waveguides and periodic grating are presented in sections 2 and 3, respectively." @default.
- W1485022046 created "2016-06-24" @default.
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- W1485022046 date "2011-06-21" @default.
- W1485022046 modified "2023-10-03" @default.
- W1485022046 title "Propagation of Electromagnetic Waves in Thin Dielectric and Metallic Films" @default.
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- W1485022046 doi "https://doi.org/10.5772/16852" @default.
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