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- W1485180863 abstract "A powerful tool for high resolution surface, interface, and thin-film analysis is the time-of-flight secondary ion mass spectrometry (ToF-SIMS). In principle, SIMS is a destructive technique since bombarding a biomaterial probe with high energetic primary cations leads to the desorption of secondary ions from the surface. This chapter outlines ToF-SIMS fundamentals and instrumentation, as well its manifold applications and perspectives, especially in the field of lung surfactant and biomembrane research. One of the grand advantages of the ToF-SIMS technique is the consolidation of chemical characterization and lateral imaging of heterogeneous sample surfaces. Lipids and also proteins can easily be analyzed in the bulk state or as dried films on a solid support to obtain ToF-SIMS mass spectra. ToF-SIMS therefore presents a key for understanding how biomolecules assemble and which parameters influence their localization in biological assemblies." @default.
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- W1485180863 date "2008-08-20" @default.
- W1485180863 modified "2023-10-04" @default.
- W1485180863 title "ToF-SIMS Imaging of Lipid/Protein Model Systems" @default.
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- W1485180863 doi "https://doi.org/10.1002/9780470388495.ch2" @default.
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