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- W1486853433 abstract "Information of special interest to crystal growers and device physicists now available from monochromatic synchrotron diffraction imaging (topography) is reviewed. Illustrations are taken from a variety of electro-optic crystals. Aspects of the detailed understanding of crystal growth processes obtainable from carefully selected samples are described. Finally, new experimental opportunities now available for exploitation are indicated." @default.
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- W1486853433 date "1988-01-01" @default.
- W1486853433 modified "2023-09-27" @default.
- W1486853433 title "X-ray diffraction imaging (topography) of electroopticcrystals by synchrotron radiation" @default.
- W1486853433 hasPublicationYear "1988" @default.
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