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- W1488660919 abstract "In this report the authors study the possibility of determining the offset in beam position-monitoring instruments (e.g. strip-line detectors) by means of changing the natural focusing strength of a planar untapered wiggler. The focusing of the wiggler provides a correlation between the transverse positions of the electron beam at different locations along the wiggler. By varying the strength of the wiggler field, it is possible to deduce the offset in the position monitors through a least square fit. The fitting is relatively straight forward if one has an ideal wiggler field free of error. Existence of wiggler field error introduces new variables into the fitting procedure. It will be shown that one needs a minimum of 2 wiggler field settings for the case without error in the wiggler field, while 4 field settings are required for the case with a particular model of the wiggler field error. The results of numerical simulations suggest that it is possible with this method to determine the offsets to an accuracy comparable with the sensitivity of strip-line monitors (i.e. a few microns)." @default.
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- W1488660919 date "1992-09-25" @default.
- W1488660919 modified "2023-09-27" @default.
- W1488660919 title "Determination of beam position monitor offset in focusing wigglers" @default.
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