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- W1493804542 abstract "where and are the current noise power and the DC current through that slice of semiconductor. , and are the variance, the mean of the carrier velocity distribution, , in the same slice, and the number of carriers in the slice respectively. means time average of the random variable . , and are the instantaneous carrier velocity, and average drift velocity of the carriers. It’s important to note however that the distribution function, , refers only to electrons with energies above the conduction band or holes with energies below the valence band, such that relates only to the carrier momentum or kinetic energy levels. The thermal noise equation (Nyquist Theorem) is recovered as an special case for the limit of eq. 1 when the DC current or the applied electric field goes to zero. Recalling the Boltzmann Transport Equation:[3]" @default.
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- W1493804542 date "1999-01-01" @default.
- W1493804542 modified "2023-09-23" @default.
- W1493804542 title "Excess Noise in Sub-micron Silicon FET: Characterization, Prediction and Control" @default.
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