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- W1495758529 abstract "Abstract The successful artifact‐free scanning near‐field optical microscopy (SNOM) for rough surfaces with the versatile apertureless internal reflection in the shear‐force gap technique is reviewed and compared with the difficulties associated with apertureless scattering and aperture SNOM techniques. The most economical technique requires sharp, economically self‐pulled, tapered waveguide tips and is enabled by a unique reflection enhancement in the shear‐force gap that depends linearly on the damping settings. Owing to numerous factors that determine the enhancement, strong chemical contrasts are obtained even between similar materials on composite materials. Unlike aperture SNOM, the contrast in an internal‐reflection SNOM is precisely at the site of the chemical interface and the optical resolution is below 10 nm, which is equal to or better than the simultaneous AFM resolution at tip radii of about 10 nm. This enables efficient local spectroscopy (fluorescence, Raman, SERS), industrial (dental alloys, textile dyeing, nanoparticle dyes, sustainable chemical production, etc.), and medicinal applications (organelles, cancer prediagnosis, etc.), and helps in the elucidation of supramolecular mechanisms, all at the nanometric level. SNOM analyses of waste‐free supramolecular gas–solid and solid–solid reactions secure far‐reaching anisotropic molecular migrations within crystals, and also in solid‐state photoreactions. Such mechanistic foundation was not possible with previous “topochemistry” hypotheses, which impeded the maturing of the unparalleled sustainable supramolecular productions, by forbidding these migrations." @default.
- W1495758529 created "2016-06-24" @default.
- W1495758529 creator A5000093100 @default.
- W1495758529 date "2012-01-27" @default.
- W1495758529 modified "2023-10-13" @default.
- W1495758529 title "Scanning Near‐Field Optical Microscopy ( <scp>SNOM</scp> )" @default.
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