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- W1504133902 abstract "In this study, we rely on low-angle annular dark-field scanning transmission electron microscopy to probe the interface strain profile in epitaxial PbTiO3∕SrTiO3 thin-films. All samples displayed a compressively strained layer at the PbTiO3∕SrTiO3 interface, with the strain vector parallel to the polarization direction. The width of the strained layer was found to be ∼15–30Å, dependent on the electrode environment. Our findings open a perspective to use interface strain engineering in combination with control of electrostatic boundary conditions as a tool to monitor the effective interface polarization. These findings have implications for future use of ferroelectrics in electronic and mechanical devices." @default.
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- W1504133902 date "2005-02-28" @default.
- W1504133902 modified "2023-10-18" @default.
- W1504133902 title "Imaging of out-of-plane interfacial strain in epitaxial PbTiO3∕SrTiO3 thin films" @default.
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- W1504133902 doi "https://doi.org/10.1063/1.1874303" @default.
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