FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W1504901984> ?p ?o ?g. }

• W1504901984 abstract "Because of their increasing degree of integration, on-board electronic components are increasingly sensitive to the heavy ions of the cosmic rays.When an energetic ion goes through a component, it generates ionization phenomena along its path. The ensuing transient (photo) current may alter the content of memory cells or perturb the functioning of logic devices (logical upset) or even destroy the component.The sensitivity of a component to heavy ions may be characterized by measuring the number of single events produced as a function of the incident energy of the particle or of the energy it looses.Two mechanisms contribute to collecting the charges generated along the ion track: funneling and diffusion. These mechanisms may be analyzed relatively easily for an ideal pn diode.In a real component, the charge collection mechanisms are more complex because of the presence of neighboring sensitive structures, of coupling phenomena and of possible short-circuits.A permanent degradation of the component may even take place because of the excitation of parasitic structures. Three such degradation modes have been identified so far: the Single Event Latchup (SEL), the Single Event Burn-out (SEB) and the Single Event Gate Rupture (SEGR).It is, to some extent, possible to compare the sensitivity of various technologies by studying their structure and the dimensions of their elementary transistors.These analyses are, however, insufficient to model the phenomena and experimental characterizations are needed. These can be performed by means of particle accelerators, radioactive sources or picosecond lasers.Methods to predict the number of logical upsets likely to occur during a mission have been devised using semi-empirical models and computer codes. In some cases, the predicted results have been compared (successfully) to results obtained on-board satellites.It is possible to harden electronic circuits against heavy ion effects by adapting the manufacturing process, and by using different cell architecture and routing.The very dynamic field of ion-component interactions will no doubt continue to grow as circuit integration continues and more electronics is flown in space." @default.
• W1504901984 created "2016-06-24" @default.
• W1504901984 creator A5028078057 @default.
• W1504901984 date "1999-01-01" @default.
• W1504901984 modified "2023-09-23" @default.
• W1504901984 title "Chapter 12 The effects of cosmic ions on electronic components" @default.
• W1504901984 cites W112633697 @default.
• W1504901984 cites W1540206583 @default.
• W1504901984 cites W1559888302 @default.
• W1504901984 cites W1590134320 @default.
• W1504901984 cites W1600162194 @default.
• W1504901984 cites W1613962479 @default.
• W1504901984 cites W1675551065 @default.
• W1504901984 cites W170335100 @default.
• W1504901984 cites W1780464704 @default.
• W1504901984 cites W1823625165 @default.
• W1504901984 cites W1889346150 @default.
• W1504901984 cites W1963564212 @default.
• W1504901984 cites W1964766608 @default.
• W1504901984 cites W1966436341 @default.
• W1504901984 cites W1967327499 @default.
• W1504901984 cites W1969045938 @default.
• W1504901984 cites W1970614522 @default.
• W1504901984 cites W1971218344 @default.
• W1504901984 cites W1972012887 @default.
• W1504901984 cites W1973887918 @default.
• W1504901984 cites W1975343266 @default.
• W1504901984 cites W1975411349 @default.
• W1504901984 cites W1979618331 @default.
• W1504901984 cites W1980361304 @default.
• W1504901984 cites W1981187632 @default.
• W1504901984 cites W1983105599 @default.
• W1504901984 cites W1983190315 @default.
• W1504901984 cites W1983192679 @default.
• W1504901984 cites W1983949102 @default.
• W1504901984 cites W1985112124 @default.
• W1504901984 cites W1985276577 @default.
• W1504901984 cites W1988617560 @default.
• W1504901984 cites W1988741813 @default.
• W1504901984 cites W1988844310 @default.
• W1504901984 cites W1989673590 @default.
• W1504901984 cites W1990376299 @default.
• W1504901984 cites W1991711773 @default.
• W1504901984 cites W1996659322 @default.
• W1504901984 cites W1997991138 @default.
• W1504901984 cites W1999009572 @default.
• W1504901984 cites W2001780764 @default.
• W1504901984 cites W2004232164 @default.
• W1504901984 cites W2005607860 @default.
• W1504901984 cites W2005838510 @default.
• W1504901984 cites W2010642899 @default.
• W1504901984 cites W2010924918 @default.
• W1504901984 cites W2013108436 @default.
• W1504901984 cites W2015521278 @default.
• W1504901984 cites W2015788320 @default.
• W1504901984 cites W2017411981 @default.
• W1504901984 cites W2018853540 @default.
• W1504901984 cites W2019922663 @default.
• W1504901984 cites W2021125729 @default.
• W1504901984 cites W2023351036 @default.
• W1504901984 cites W2023731276 @default.
• W1504901984 cites W2023856022 @default.
• W1504901984 cites W2024262093 @default.
• W1504901984 cites W2027628860 @default.
• W1504901984 cites W2027720553 @default.
• W1504901984 cites W2028368718 @default.
• W1504901984 cites W2029026928 @default.
• W1504901984 cites W2029866382 @default.
• W1504901984 cites W2030501553 @default.
• W1504901984 cites W2033363227 @default.
• W1504901984 cites W2034484581 @default.
• W1504901984 cites W2036580281 @default.
• W1504901984 cites W2037576944 @default.
• W1504901984 cites W2037769643 @default.
• W1504901984 cites W2039344122 @default.
• W1504901984 cites W2041024106 @default.
• W1504901984 cites W2042640145 @default.
• W1504901984 cites W2043439851 @default.
• W1504901984 cites W2043483139 @default.
• W1504901984 cites W2043724597 @default.
• W1504901984 cites W2044866924 @default.
• W1504901984 cites W2044908336 @default.
• W1504901984 cites W2046370100 @default.
• W1504901984 cites W2046698147 @default.
• W1504901984 cites W2046933023 @default.
• W1504901984 cites W2049064049 @default.
• W1504901984 cites W2052740467 @default.
• W1504901984 cites W2054593687 @default.
• W1504901984 cites W2056634481 @default.
• W1504901984 cites W2058215919 @default.
• W1504901984 cites W2058575301 @default.
• W1504901984 cites W2059133251 @default.
• W1504901984 cites W2060852948 @default.
• W1504901984 cites W2061149628 @default.
• W1504901984 cites W2062567459 @default.
• W1504901984 cites W2068910140 @default.
• W1504901984 cites W2073308468 @default.
• W1504901984 cites W2074587844 @default.
• W1504901984 cites W2074673023 @default.
• W1504901984 cites W2082279488 @default.

• next