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- W1511159124 abstract "We succeeded in fabricating ultra-short 30-nm-gate InP-based high electron mobility transistors (HEMTs) with an extremely high current gain cutoff frequency (f/sub T/) of 547 GHz. The superior high-speed performance of our InP-HEMTs was mainly due to their optimized gate-recess structures. We investigated the effect of lateral gate-recess length on f/sub T/ with the asymmetric gate-recess technique, and clarified the impact of source- and drain-side recess lengths on their high-speed performance from the viewpoint of electron velocity and source resistance. We also demonstrated the importance of parasitic resistances, which were no longer negligible in these ultra-high-speed InP-HEMTs." @default.
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- W1511159124 date "2005-04-12" @default.
- W1511159124 modified "2023-09-26" @default.
- W1511159124 title "HEMTs with ultrahigh cutoff frequency" @default.
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- W1511159124 doi "https://doi.org/10.1109/iscs.2003.1239985" @default.
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