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• W1514625444 abstract "A novel approach to quantitative deformation characterization of high-resolution electron microscopy (HREM) defect images has been developed. The essential principle of this technique, called Computational Fourier Transform Deformation (CFTD) analysis, is to extract an accurate displacement field about a defect from its HREM image using Fourier transformation procedures. The methodology's unique feature is to digitize the defect image and compute the Moire pattern, from which the displacement field is obtained, without the need for an external reference lattice image, normally associated with the interference phenomena. Details of the image processing steps are described elsewhere. The motivation is that from this data, the displacement gradient can be calculated which yields much information on the experimental deformation mechanics of some solid undergoing a specific growth process or mechanical testing. One question that has arisen is whether different imaging conditions of the same defect affects the results of the CFTD analysis. We have studied this problem by analyzing the strain components of simulated images of a Lomer dislocation in Si and present our findings here." @default.
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• W1514625444 date "1992-08-01" @default.
• W1514625444 modified "2023-09-25" @default.
• W1514625444 title "Determination of the strain field from an HREM image of a Si lomer dislocation" @default.
• W1514625444 cites W2037782625 @default.
• W1514625444 doi "https://doi.org/10.1017/s0424820100121120" @default.
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