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- W1515565614 abstract "This paper presents a reliability evaluation methodology to obtain the statistical reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories. This methodology can be also used to generate overdriving guidelines and characterize production lines in commercial applications and to obtain de-rating guidelines in space applications." @default.
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- W1515565614 date "2004-07-08" @default.
- W1515565614 modified "2023-10-01" @default.
- W1515565614 title "A reliability evaluation methodology for memory chips for space applications when sample size is small" @default.
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- W1515565614 doi "https://doi.org/10.1109/irws.2003.1283307" @default.
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