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• W1517774619 abstract "We present both heavy ion and alpha test results for SPARCV8 pipelined-microprocessors fabricated in a space CMOS 65nm platform. Two design implementations, standard and radiation-hardened, are compared at 50/300MHz and 0.8V/1.2V. The dominant failure modes are identified and the failure cross-section is compared with fault injection prediction." @default.
• W1517774619 created "2016-06-24" @default.
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• W1517774619 date "2015-04-01" @default.
• W1517774619 modified "2023-10-02" @default.
• W1517774619 title "Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test" @default.
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• W1517774619 doi "https://doi.org/10.1109/irps.2015.7112830" @default.
• W1517774619 hasPublicationYear "2015" @default.
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