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• W1518452214 abstract "TCAD has been a useful tool for device design for decades. Radiation damage of devices requires accurate simulation of how charges move and are trapped, and the trap populations. This paper describes a simulation capability for these classes of problems and provides examples demonstrating its usefulness for investigation of device failure." @default.
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• W1518452214 date "2015-08-01" @default.
• W1518452214 modified "2023-09-27" @default.
• W1518452214 title "Total Dose Radiation Damage: A Simulation Framework" @default.
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• W1518452214 doi "https://doi.org/10.1109/tns.2015.2425226" @default.
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