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- W1520696437 abstract "When analyzing reliability, wires have in most cases been ignored, with gates taking the lion's share, and devices being considered only once in a while. With scaling, this “only-computations-fail” approach is not going to be accurate enough as wires will also start to err. Trying to do justice to communication (wires), this paper details a statistical failure analysis of wires following on the few papers which have made wires' reliability their concern. We will use a classical particle-like probabilistic approach to enhance on the accuracy of wires' length-dependent probabilities of failure due to the discreetness of charge. Covering some of the intrinsic noises, such an approach leads to “lower bound”-like wire reliability estimates, as ignoring other intrinsic noises, as well as extrinsic noises, variations, and defects. These results should have implications for design strategies of multi-/many-cores and networks-on-chip, as well as for forward-looking investigations on emerging nano-architectures." @default.
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- W1520696437 date "2009-07-26" @default.
- W1520696437 modified "2023-09-26" @default.
- W1520696437 title "On wires at low electron densities" @default.
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