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- W152298997 endingPage "556" @default.
- W152298997 startingPage "550" @default.
- W152298997 abstract "Dans la methode, la defaillance de LSI est classee suivant plusieurs modes de defaillance et la vitesse de defaillance est exprimee en fonction des parametres de conception d'un circuit LSI" @default.
- W152298997 created "2016-06-24" @default.
- W152298997 creator A5031726295 @default.
- W152298997 creator A5077142004 @default.
- W152298997 creator A5078464682 @default.
- W152298997 date "1983-09-25" @default.
- W152298997 modified "2023-09-27" @default.
- W152298997 title "Failure rate prediction method for LSIs" @default.
- W152298997 hasPublicationYear "1983" @default.
- W152298997 type Work @default.
- W152298997 sameAs 152298997 @default.
- W152298997 citedByCount "0" @default.
- W152298997 crossrefType "journal-article" @default.
- W152298997 hasAuthorship W152298997A5031726295 @default.
- W152298997 hasAuthorship W152298997A5077142004 @default.
- W152298997 hasAuthorship W152298997A5078464682 @default.
- W152298997 hasConcept C127413603 @default.
- W152298997 hasConcept C163164238 @default.
- W152298997 hasConcept C200601418 @default.
- W152298997 hasConcept C41008148 @default.
- W152298997 hasConceptScore W152298997C127413603 @default.
- W152298997 hasConceptScore W152298997C163164238 @default.
- W152298997 hasConceptScore W152298997C200601418 @default.
- W152298997 hasConceptScore W152298997C41008148 @default.
- W152298997 hasIssue "9" @default.
- W152298997 hasLocation W1522989971 @default.
- W152298997 hasOpenAccess W152298997 @default.
- W152298997 hasPrimaryLocation W1522989971 @default.
- W152298997 hasVolume "66" @default.
- W152298997 isParatext "false" @default.
- W152298997 isRetracted "false" @default.
- W152298997 magId "152298997" @default.
- W152298997 workType "article" @default.