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- W1532055802 abstract "This chapter presents an overview of the current state of the art of volumetric displacement field imaging using optical interferometric techniques. It describes the interferometric depth-resolving displacement-sensing technique to be developed was known as low-coherence speckle pattern interferometry. The chapter introduces the two main techniques, namely, wavelength scanning interferometry (WSI) and tilt scanning interferometry (TSI), which refer, respectively, to the cases of time-varying wavenumber and time-varying illumination direction. It also presents a theoretical framework based on the Ewald sphere that, by means of a simple geometrical construction, allows one to visualize the spatial resolution and displacement component measured by any of the techniques. The chapter reviews recent developments on phase unwrapping in three dimensions. It describes three optical arrangements: first a 2D phase contrast-spectral optical coherence tomography (PC-SOCT) system for single-shot measurement of out-of-plane displacement fields, followed by an adaptation to allow measurement of both in-plane and out-of-plane displacement fields. Controlled Vocabulary Terms displacement measurement; electromagnetic wave interferometry; electronic speckle pattern interferometry" @default.
- W1532055802 created "2016-06-24" @default.
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- W1532055802 date "2011-02-21" @default.
- W1532055802 modified "2023-09-30" @default.
- W1532055802 title "Depth‐Resolved Displacement Field Measurement" @default.
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- W1532055802 doi "https://doi.org/10.1002/9783527633852.ch2" @default.
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